Publicaciones

Affichage de 6201 à 6210 sur 16256


  • Article dans une revue

In-flow detection of ultra-small magnetic particles by an integrated giant magnetic impedance sensor

Kamel Fodil, Matthieu Denoual, Christophe Dolabdjian, A. Treizebre, Vincent Senez

Applied Physics Letters, 2016, ⟨10.1063/1.4948286⟩. ⟨hal-01417815⟩

  • Communication dans un congrès

Development of a reference wafer for on-wafer testing of extreme impedance devices

H. Votsi, I. Roch-Jeune, Kamel Haddadi, C. Li, Gilles Dambrine, P. H. Aaen, N. Ridler

This paper describes the design, fabrication, and testing of an on-wafer substrate that has been developed specifically for measuring extreme impedance devices using an on-wafer probe station. Such devices include carbon nano-tubes (CNTs) and structures based on graphene which possess impedances in...

88th ARFTG Microwave Measurement Symposium, ARFTG 2016, Dec 2016, Austin, United States. 4 p., ⟨10.1109/ARFTG.2016.7839719⟩. ⟨hal-03224658⟩

  • Article dans une revue

High photocatalytic activity of plasmonic Ag@AgCl/Zn2 SnO4 nanocomposites synthesized using hydrothermal method

Monaam Ben Ali, Abderrahmane Hamdi, Habib Elhouichet, Brigitte Sieber, Ahmed Addad, Yannick Coffinier, Luc Boussekey, Mokhtar Férid, Sabine Szunerits, Rabah Boukherroub

Ag@AgCl/Zn 2 SnO 4 (ZTO) nanocomposites were successfully prepared by a hydrothermal method.

RSC Advances, 2016, 6 (83), pp.80310-80319. ⟨10.1039/C6RA14813A⟩. ⟨hal-03837468⟩

  • Article dans une revue

Wetting characterization of high aspect ratio nanostructures by gigahertz acoustic reflectometry

Christophe Virgilio, Julien Carlier, Pierre Campistron, Malika Toubal, Philippe Garnier, L. Broussous, V. Thomy, Bertrand Nongaillard

Wetting efficiency of microstructures or nanostructures patterned on Si wafers is a real challenge in integrated circuits manufacturing. In fact, bad or non-uniform wetting during wet processes limits chemical reactions and can lead to non-complete etching or cleaning inside the patterns and device...

International Journal of Mechanical and Mechatronics Engineering, 2016, 10 (3), pp.413-418. ⟨hal-03560404⟩

  • Communication dans un congrès

Metal/insulator/semiconductor contacts for ultimately scaled CMOS nodes: projected benefits and remaining challenges

Julien Borrel, Louis Hutin, Helen Grampeix, Emmanuel Nolot, Magali Tessaire, Guillaume Rodriguez, Yves Morand, Fabrice Nemouchi, Magali Gregoire, Emmanuel Dubois, Maud Vinet

In this paper, some key fundamental aspects of Metal / Insulator / Semiconductor contacts as well as practical issues occurring with their implementation are reviewed in order to fully comprehend the opportunities and limitations of this approach.

IWJT 2016 - 16th International Workshop on Junction Technology, May 2016, Shanghai, China. pp.14-19. ⟨hal-03325000⟩