Publicaciones

Affichage de 6901 à 6910 sur 16173


  • Communication dans un congrès

InAs based Esaki tunnel diodes

Vinay Kumar Chinni, L. Desplanque, Mohamed Zaknoune, Xavier Wallart

We present simulation results of InAs based Esaki tunnel diodes. InAs homojunction and InAs/AlGaSb heterojunction are considered and we investigate the role of source and drain doping levels as well as band energy discontinuities on the tunneling current of the device. The results are very...

17èmes Journées Nationales du Réseau Doctoral en Micro-Nanoélectronique, JNRDM 2014, 2014, Villeneuve d'Ascq, France. 3 p. ⟨hal-01018430⟩

  • Communication dans un congrès

Near-field microscopy : from MIR to THz

Gabriel Moreno, Antoine Pagies, Damien Ducatteau, Nicolas Clément, Tahsin Akalin, Mathias Vanwolleghem, Jean-Francois Lampin

joint 25th Conference of the Condensed Matter Division of the European Physical Society, and 14èmes Journées de la Matière Condensée, CMD25-JMC14, 2014, Paris, France. 2 p. ⟨hal-01015277⟩

  • Communication dans un congrès

A 1D optomechanical crystal with a complete phononic band gap

Jordi Gomis-Bresco, Daniel Navarro Urrios, Mourad Oudich, Said El-Jallal, Amadeu Griol, Daniel Puerto, Emigdio Chávez-Ángel, Yan Pennec, Bahram Djafari-Rouhani, Francesc Alzina, Alejandro Martinez, Clivia Sotomayor-Torres

Joint 25th Conference of the Condensed Matter Division of the European Physical Society, and 14èmes Journées de la Matière Condensée, CMD25-JMC14, 2014, Paris, France. ⟨hal-01015239⟩

  • Article dans une revue

Thermal management of electronic devices by composite materials integrated in silicon

Emmanuel Ollier, U. Soupremanien, V. Remondiere, J. Dijon, H. Le Poche, A.L. Seiler, F. Lefevre, S. Lips, Christophe Kinkelin, Nathalie Rolland, Paul-Alain Rolland, Malek Zegaoui, S. Lhostis, P. Ancey, B. Descouts, Y. Kaplan

As the power of electronic systems is increasing, thermal fluxes are getting higher, up to more than 100 W/cm2 in the more critical cases. They result in hot spots with various consequences, especially performance reduction and reliability issues. Most of the prior research has been focused on...

Microelectronic Engineering, 2014, 127, pp.28-33. ⟨10.1016/j.mee.2014.03.016⟩. ⟨hal-01005617⟩