Publicaciones
Affichage de 7361 à 7370 sur 16227
Resonant TE Transmission Through a Continuous Metal Film: Perspectives for Low-Loss Plasmonic Elements
S. Tonchev, O. Parriaux, T. Tenev, I. Miloushev, David Troadec, G. Patriarche
Plasmonics, 2013, 8 (2), pp.829-833. ⟨10.1007/s11468-013-9479-0⟩. ⟨ujm-00864880⟩
Mechanics and Machines. How science Worked and How Techniques Worked?
Raffaele Pisano
Workshop in History of Science, SCité Centre, University of Lille 1 & University of Alger (France-Algery), Jan 2013, Lille (FR), France. ⟨hal-04518657⟩
Nano photoconductive switches for microwave applications
Charlotte Tripon-Canseliet, Salim Faci, Didier Decoster, Sonn Fatt Yoon, Jean Chazelas
SPIE Photonics West 2013, Feb 2013, San francisco, United States. ⟨hal-00751489⟩
Selenium surface energy determination from size-dependent considerations
G. Guisbiers, S. Arscott, M. Gaudet, A. Belfiore, R. Snyders
2013 IEEE International Nanoelectronics Conference (INEC), Jan 2013, Singapore, Malaysia. pp.105-109, ⟨10.1109/INEC.2013.6465968⟩. ⟨hal-02345672⟩
Low-temperature crystallization of high performance Pb0.4Sr 0.6TiO3 films compatible with the current silicon-based microelectronic technology
K. Li, Denis Remiens, X.L. Dong, J. Costecalde, N. Sama, T. Li, G. Du, Y. Chen, G.S. Wang
Applied Physics Letters, 2013, 102, 212901, 4 p. ⟨10.1063/1.4807792⟩. ⟨hal-00877663⟩
Hidden surface states at non-polar GaN (101¯0) facets : intrinsic pinning of nanowires
L. Lymperakis, P.H. Weidlich, H. Eisele, M. Schnedler, J.P. Nys, B. Grandidier, D. Stiévenard, R.E. Dunin-Borkowski, J. Neugebauer, P. Ebert
Applied Physics Letters, 2013, 103, 152101, 4 p. ⟨10.1063/1.4823723⟩. ⟨hal-00877636⟩
Coherent tunnelling across a quantum point contact in the quantum Hall regime
F. Martins, S. Faniel, B. Rosenow, Hermann Sellier, Serge Huant, M. G. Pala, L. Desplanque, X. Wallart, Vincent Bayot, B. Hackens
Scientific Reports, 2013, 3, pp.1416. ⟨10.1038/srep01416⟩. ⟨hal-00932989⟩
Six-port-based compact and low-cost near-field 35 GHz microscopy platform for non-destructive evaluation
Kamel Haddadi, T. Lasri
NDT & E International, 2013, 55, pp.102-108. ⟨10.1016/j.ndteint.2013.01.018⟩. ⟨hal-00797211⟩
True planar InAs/AlSb HEMTs with ion-implantation technique for low-power cryogenic applications
G. Moschetti, M. Abbasi, P.A. Nilsson, A. Hallen, L. Desplanque, X. Wallart, J. Grahn
Solid-State Electronics, 2013, 79, pp.268-273. ⟨10.1016/j.sse.2012.06.013⟩. ⟨hal-00795944⟩
[Invited] Assessment of transistors based on GaN on silicon substrate in view of integration with silicon technology
A. Soltani, Y. Cordier, J.C. Gerbedoen, S. Joblot, Etienne Okada, M. Chmielowska, M.R. Ramdani, Jean-Claude de Jaeger
Semiconductor Science and Technology, 2013, 28, pp.094003-1-6. ⟨10.1088/0268-1242/28/9/094003⟩. ⟨hal-00872010⟩