Publicaciones

• Article dans une revue

Study of the effect of gas pressure and catalyst droplets number density on silicon nanowires growth, tapering, and gold coverage

W.H. Chen, Rodrigue Lardé, E. Cadel, T. Xu, B. Grandidier, J.P. Nys, D. Stievenard, Philippe Pareige

We investigated the growth of silicon nanowires from Au-rich catalyst droplets by two different methods: chemical vapor deposition (CVD) and molecular beam epitaxy (MBE). The growth rate is found to be diameter-dependent and increases with increasing precursor partial pressures. The comparison of...

Journal of Applied Physics, 2010, 107 (8), pp.0849028. ⟨10.1063/1.3359648⟩. ⟨hal-00549438⟩

• Communication dans un congrès

Experimental and numerical investigation of the impact of pulse duration on supercontinuum generation in a photonic crystal fiber

Marco Andreana, Anne Bertrand, Y. Hernandez, Philippe Leproux, Vincent Couderc, S. Hilaire, Guillaume Huss, D. Giannone, Alessandro Tonello, Alexis Labruyère

We present an experimental and numerical study of supercontinuum (SC) generation in a photonic-crystal fiber pumped by optical pulses with constant peak power and adjustable duration, in the range from 185 ps to 1.81 ns.

Nonlinear Photonics, Jun 2010, Karlsruhe, Germany. pp.1-3. ⟨hal-00622263⟩

• Article dans une revue

Realization of vertical silicon nanowire networks with an ultra high density using a top-down approach

X.L. Han, G. Larrieu, Emmanuel Dubois

Journal of Nanoscience and Nanotechnology, 2010, 10, pp.7423-7427. ⟨10.1166/jnn.2010.2841⟩. ⟨hal-00549625⟩

• Article dans une revue

Frequency dependent rotation and translation of nanowires in liquid environment

M. Marczak, D. Hourlier, Thierry Melin, L. Adamowicz, H. Diesinger

Applied Physics Letters, 2010, 96, pp.233502-1-3. ⟨10.1063/1.3430738⟩. ⟨hal-00549071⟩

• Article dans une revue

Doping incorporation in InAs nanowires characterized by capacitance measurements

G. Astromskas, K. Storm, O. Karlström, P. Caroff, M. Borgström, L.E. Wernersson

Journal of Applied Physics, 2010, 108, pp.054306-1-5. ⟨10.1063/1.3475356⟩. ⟨hal-00548710⟩

• Article dans une revue

GaSb/GaP compliant interface for high electron mobility AlSb/InAs heterostructures on (001) GaP

S. El Kazzi, L. Desplanque, Christophe Coinon, Y. Wang, P. Ruterana, X. Wallart

Applied Physics Letters, 2010, 97, pp.192111-1-3. ⟨10.1063/1.3515867⟩. ⟨hal-00548719⟩

• Communication dans un congrès

Dual phononic and photonic band gaps in a periodic array of dots on a thin membrane

Y. El Hassouani, C. Li, Yan Pennec, Bahram Djafari-Rouhani, E.H. El Boudouti, Abdellatif Akjouj, Olivier Bou Matar, A. Martinez

1st Mediterranean Congress on Acoustics, MCA 2010, 2010, Salé, Morocco. ⟨hal-00808232⟩

• Article dans une revue

Ultrasonic and acoustic investigation of cheese matrix at the beginning and the end of ripening period

Georges Nassar, Fabrice Lefebvre, A. Skaf, Julien Carlier, Bertrand Nongaillard, Y. Noel

In this paper, a low frequency, dry contact, ultrasonic technique devoted to the study and characterization of cheeses at the beginning and the end of ripening period is investigated. For compact or weakly opened matrix found in the early step of cheese making, ultrasonic velocity is indicated to...

Journal of Food Engineering, 2010, 96, pp.1-13. ⟨10.1016/j.jfoodeng.2009.06.029⟩. ⟨hal-00549529⟩

• Chapitre d'ouvrage

Electrostatic force microscopy and Kelvin force microscopy as a probe of the electrostatic and electronic properties of carbon nanotubes

Thierry Melin, Mariusz Zdrojek, David Brunel

This chapter addresses recent experimental studies on carbon nanotubes and nanotube devices using electrical techniques derived from atomic force microscopy. Electrostatic force microscopy (EFM), Kelvin force microscope (KFM), and their variants are introduced. We show how EFM-related techniques...

B. Bhushan. Scanning probe microscopy in nanoscience and nanotechnology, Springer, chapitre 4, 89-128, 2010, ⟨10.1007/978-3-642-03535-7_4⟩. ⟨hal-00575864⟩

• Article dans une revue

Materials selection procedure for RF-MEMS

G. Guisbiers, E. Herth, Bernard Legrand, N. Rolland, T. Lasri, L. Buchaillot

Microelectronic Engineering, 2010, 87, pp.1792-1795. ⟨10.1016/j.mee.2009.10.016⟩. ⟨hal-00549627⟩