Publications
Affichage de 14281 à 14290 sur 16261
Non-linear phenomenological model for RF advanced MOSFET
A. Siligaris, Gilles Dambrine, Sylvie Lepilliet, D. Schreurs, Francois Danneville
European IC-CAP User Meeting, 2003, Prague, Czech Republic. ⟨hal-00146016⟩
SU-8 technology and monolithic columns for integration in a biological lab-on-chip
Julien Carlier, S. Le Gac, S. Arscott, V. Thomy, J.C. Fourrier, F. Caron, C. Cren-Olive, C. Rolando, J.C. Camart, P. Tabourier
2003, pp.315-318. ⟨hal-00146385⟩
Optimisation and modelling of pentacene-based organic thin film on high-k gate dielectrics
K. Lmimouni, M. Berliocchi, C. Dufour, Denis Remiens, D. Vuillaume, G. Velu, C. Legrand
7th European Conference on Molecular Electronics, ECME 2003, 2003, Avignon, France. ⟨hal-00146178⟩
Self-assembled molecular rectifying diodes on silicon : synthesis, experimental and theoretical charge transport studies
Stéphane Lenfant, Dominique Vuillaume, Christophe Krzeminski, Guy Allan, Christophe Delerue, F. Tran Van, C. Chevrot
7th European Conference on Molecular Electronics, ECME 2003, Sep 2003, Avignon, France. ⟨hal-00146179⟩
Nonlinear electron transport in InGaAs/InAlaS ballistic devices
Benoit Hackens, L. Gence, Sébastien Faniel, Cédric Gustin, Hervé Boutry, Lukasz Bednarz, Isabelle Huynen, Vincent Bayot, X. Wallart, A. Cappy, Javier Mateos, Tomás González
Trends in NanoTechnology, TNT 2003, Sep 2003, Salamanca, Spain. ⟨hal-00146041⟩
IEMN : a center of the french network for basic research in Micro@Nano technology
A. Cappy
Trends in NanoTechnology, TNT 2003, 2003, Salamanca, Spain. ⟨hal-00146046⟩
Contrôle des diagrammes de rayonnement par radômes métallo-diélectriques et métamatériaux
T. Akalin, J. Ciberta, R. Lalinde, O. Vanbésien, E. Estebe, D. Lippens
2003, pp.5D-4. ⟨hal-00146085⟩
Influence on the step covering on fatigue phenomenon for polycrystalline silicon MEMS
O. Millet, Bernard Legrand, D. Collard, L. Buchaillot
Japanese Journal of Applied Physics, 2003, 41, pp.L1339-L1341. ⟨hal-00146435⟩
Feedback of MEMS reliability study on the design stage : a step toward reliability aided design (RAD)
L. Buchaillot
Microelectronics Reliability, 2003, 43, pp.1919-1928. ⟨hal-00146437⟩
Etude et optimisation de commutateurs DOS à haute diaphotie sur InP
Malek Zegaoui, Joseph Harari, V. Magnin, Didier Decoster
22èmes Journées Nationales d'Optique Guidée, JNOG 2003, Nov 2003, Valence, France. ⟨hal-00146563⟩