Publications
Affichage de 14351 à 14360 sur 16261
Raman characterization of Mg+ ion-implanted GaN
B. Boudart, Yannick Guhel, J. C. Pesant, Paul Dhamelincourt, M.A. Poisson
7th International Workshop on Beam Injection Assessment of Microstructures in Semiconductors, 2003, Lille, France. ⟨hal-01649531⟩
Modélisation en ondes millimétriques du TEC froid. Application aux modulateurs microondes
Zaki Leghtas
2003. ⟨hal-00145987⟩
Room temperature nonlinear transport in InGaAs/InAlAs based ballistic nanodevices
Javier Mateos, B.G. Vasallo, Daniel Pardo, Tomás González, Hervé Boutry, Benoit Hackens, Vincent Bayot, Lukasz Bednarz, Philippe Simon, Isabelle Huynen, Jean-Sebastien Galloo, Emmanuelle Pichonat, Yannick Roelens, X. Wallart, S. Bollaert, A. Cappy
International Conference onIndium Phosphide and Related Materials, May 2003, Barbara, CA, France. pp.484-487. ⟨hal-00145996⟩
Electronic and optical approach for generation in the terahertz gap
D. Lippens
3rd ESA Workshop on Millimeter Wave Technology and Applications, 2003, Helsinki, Finland. ⟨hal-00146090⟩
Self-assembled monolayers and molecular-scale electronics
D. Vuillaume
Nano et micro technologies, 2003, 3, pp.35-57. ⟨hal-00146157⟩
Giant magnetostriction nanostructures for actuation of microsystems
Philippe Pernod, Vladimir Preobrazhensky
2003, pp.7. ⟨hal-00146135⟩
Nouvel applicateur planaire pour thermothérapie microonde
Julien Carlier, V. Thomy, J.C. Camart, Luc Dubois, J. Pribetich
13èmes Journées Nationales Microondes, JNM 2003, 2003, Lille, France. pp.122-124. ⟨hal-00146067⟩
Deposition of ferroelectric BST thin films by sol gel route in view of electronic applications
G. Velu, Jean-Claude Carru, Eric Cattan, Denis Remiens, X. Melique, D. Lippens
Ferroelectrics, 2003, 288 (1), pp.59-69. ⟨10.1080/00150190390212007⟩. ⟨hal-00146068⟩
Techniques for mechanical strain analysis in submicron structures : TEM/CBED, micro-Raman spectroscopy, X-RAY micro-diffraction and modelling
I. de Wolf, V. Senez, R. Balboni, A. Armigliato, S. Frabboni, A. Cedola, S. Lagomarsino
Microelectronic Engineering, 2003, 70, pp.425-435. ⟨hal-00146410⟩