Publications

Affichage de 13711 à 13720 sur 16551


  • Communication dans un congrès

Impact of the intrinsic parameters of the dielectric on the leakage current

G. Larrieu, M. Tao

2nd International Workshop on Advanced Gate Stack Technology, 2005, Austin, TX, United States. ⟨hal-00138407⟩

  • Communication dans un congrès

Explicit versus implicit finite-difference approximation for semiconductor device time-domain macroscopic numerical modelling on parallel computer

A. El Moussati, Christophe Dalle

Proceedings of the 15th Workshop on Modelling and Simulation of Electron Devices, 2005, Pisa, Italy. ⟨hal-00131335⟩

  • Communication dans un congrès

Organic field effect transistor based on a novel soluble pentacene precursor and operating at low voltages

D. Zander, N. Hoffmann, K. Lmimouni, S. Lenfant, C. Petit, D. Vuillaume

14th Biennial Conference on Insulating Films on Semiconductors, 2005, Belgium. pp.394-397, ⟨10.1016/j.mee.2005.04.096⟩. ⟨hal-00247650⟩

  • Article dans une revue

Reaction pathways during the thermal conversion of polysiloxane precursors into oxycarbide ceramics

D. Bahloul-Hourlier, J. Latournerie, P. Dempsey

Journal of the European Ceramic Society, 2005, 25, pp.979-985. ⟨10.1016/j.jeurceramsoc.2004.05.012⟩. ⟨hal-00247488⟩

  • Article dans une revue

Biaxial initial stress characterization of bilayer gold RF-switches

K. Yacine, F. Flourens, David Bourrier, Ludovic Salvagnac, P. Calmont, X. Lafontan, Q.H. Duong, L. Buchaillot, D. Peyrou, Patrick Pons, Robert Plana

Microelectronics Reliability, 2005, 45, pp.1776-1781. ⟨10.1016/j.microrel.2005.07.093⟩. ⟨hal-00128652⟩

  • Communication dans un congrès

On the high-frequency noise figures of merit and microscopic channel noise sources in fabricated 90 nm PD SOI MOSFETs

R. Rengel, M.J. Martin, G. Pailloncy, Gilles Dambrine, Francois Danneville

2005, pp.745-748. ⟨hal-00125309⟩

  • Communication dans un congrès

A metamorphic GaAs HEMT distributed amplifier with 50 GHz bandwidth and low noise for 40 Gbits/s optical receivers

G. Wolf, S. Demichel, R. Leblanc, F. Blache, R. Lefevre, Gilles Dambrine, H. Happy

2005, pp.93-95. ⟨hal-00125302⟩