Publications

Affichage de 12641 à 12650 sur 16261


  • Autre publication scientifique

Jonctions nanométriques à base d'électrodes ou de nanofils en siliciure de titane

T. Soubiron

2006. ⟨hal-00162822⟩

  • Communication dans un congrès

Caractérisation de nanofils de Si par sonde atomique tomographique

R. Lardé, J. Houard, E. Cadel, P. Pareige, D. Hourlier, D. Stievenard

10èmes Journées de la Matière Condensée, 2006, Toulouse, France. ⟨hal-00243976⟩

  • Communication dans un congrès

Catalytic growth of silicon nanowires supported on high surface oxide substrates

D. Hourlier, P. Lefebvre, A. Addad, R.N. Vannier, P. Perrot

Matériaux 2006, 2006, Dijon, France. ⟨hal-00243979⟩

  • Communication dans un congrès

Raman spectroscopy and AFM characterization on individual Si-based nanowires

M. Marczak, M. Zdrojek, W. Gebicki, C. Jastrzebski, Thierry Melin, D. Hourlier

European Material Research Society Spring Meeting, E-MRS - IUMRS - ICEM 06, Symposium E : Science and Technology of Nanotubes and Nanowires, 2006, Nice, France. ⟨hal-00243973⟩

  • Article dans une revue

Water exclusion at the nanometer scale provides long term passivation of silicon(111) grafted with alkyl monolayers

P. Gorostiza, C. Henry de Villeneuve, Q.Y. Sun, F. Sanz, X. Wallart, Rabah Boukherroub, P. Allongue

Journal of Physical Chemistry B, 2006, 110, pp.5576-5585. ⟨hal-00127062⟩

  • Communication dans un congrès

On the crucial role of the insulator-semiconductor interface in organic thin film transistors

G. Horowitz, M. Mottaghi, P. Lang, F. Rodriguez, A. Yassar, S. Lenfant, D. Vuillaume

SPIE Annual Meeting, Symposium on Organic Field-Effect Transistors V, 2006, San Diego, CA, United States. ⟨hal-00127155⟩

  • Communication dans un congrès

Running current through a single non resonant quantum state in silicon

Maxime Berthe, A. Urbieta, R. Stiufiuc, B. Grandidier, D. Deresmes, C. Delerue, D. Stiévenard, R. Rurrali, N. Lorente, L. Magaud, P. Ordejon

European Conference on Surface Science, ECOSS 24, 2006, Paris, France. ⟨hal-00127916⟩

  • Communication dans un congrès

Role of interfaces on the direct tunneling and the inelastic tunneling behaviors in metal/alkylsilane/silicon junctions

D. Vuillaume, D. K. Aswal, David Guérin, S. Lenfant, C. Petit, G. Salace, J. V. Yakhmi

Materials Research Society Spring Meeting, 2006, San Francisco, CA, United States. ⟨hal-00127160⟩