Publications
Affichage de 13811 à 13820 sur 16261
Application of PZT-film-Si-substrate structures for various types of position sensitive pyroelectric detectors of radiation
S. Bravina, Eric Cattan, N. Morozovsky, Denis Remiens
Pandalai S.G. Recent Research Developments in Applied Physics, Vol. 7, Part I, Research Signpost, Kerala, India, pp.177-196, 2004. ⟨hal-00139043⟩
Self-assembled molecular diodes on silicon
S. Lenfant, C. Merckling, David Guérin, D. Vuillaume, F. Tran Van, C. Chevrot
Ultimate Lithography and Nanodevice Engineering, 2004, Agelonde, France. ⟨hal-00140751⟩
Caractérisation de films d'alcènes greffés sur des surfaces Si(111) par analyse XPS résolue angulairement
X. Wallart, C. Henry de Villeneuve, P. Allongue
2004, pp.152-157. ⟨hal-00140723⟩
Effects of grain boundaries, field dependent mobility and interface state traps on the characteristics of pentacene thin film transistor
A. Bolognesi, M. Berliocchi, M. Manenti, Aldo Di Carlo, Paolo Lugli, Kamal Lmimouni, Claude Dufour
IEEE Transactions on Electron Devices, 2004, 51 (12), pp.1997-2003. ⟨10.1109/TED.2004.838333⟩. ⟨hal-00140735⟩
Silicon-molecules-metal junctions by nanotransfer printing
C. Merckling, David Guérin, S. Lenfant, D. Vuillaume
French-Japan Workshop on Nanomaterials, 2004, Bordeaux, France. ⟨hal-00140758⟩
Modelisation et simulation de la technlogie MOS ultimes
E. Lampin, Christophe Krzeminski, T. Alkalin, V. Cuny
GDR Nanoélectronique, 2004, Aussois, France. ⟨hal-00140992⟩
Depth dependence of defect evolution and TED during annealing
B. Colombeau, N.E.B. Cowern, Fuccio Cristiano, P. Calvo, Y. Lamrani, Nikolay Cherkashin, E. Lampin, Alain Claverie
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 2004, 216, pp.90-94. ⟨hal-00140976⟩
Transistor MOSFET Schottky en régime nanométrique
G. Larrieu, Emmanuel Dubois
Journées Nationales Nanoélectronique, 2004, Aussois, France. ⟨hal-00140994⟩
Evaluation of electrical impedance spectra for single biocells in microfluidic devices using combined FEMLAB/ HSPICE simulated models
V. Senez, T. Yamamoto, B. Poussard, T. Fukuba, J.M. Capron, T. Fujii
2004, pp.99-102. ⟨hal-00141012⟩
Reliability of polycrystalline MEMS : prediction of the debugging-time
O. Millet, Pierre Bertrand, Bernard Legrand, D. Collard, L. Buchaillot
International Symposium for Testing and Failure Analysis, ISTFA 2004, 2004, Worcester, MA, United States. ⟨hal-00141030⟩