Publications
Affichage de 14901 à 14910 sur 16261
Vacuum and cryogenic station for Micro-Electro-Mechanical Systems probing and testing
Bernard Legrand, E. Quévy, B. Stefanelli, D. Collard, L. Buchaillot
Review of Scientific Instruments, 2002, 73, pp.4393-4395. ⟨hal-00148782⟩
Microcapteurs de rayonnement infrarouge en technologie silicium
Mohamed Boutchich
2002. ⟨hal-00148731⟩
Characterization of phosphorus and boron heavily doped LPCVD polysilicon films in the temperature range 293-373K
Mohamed Boutchich, Katir Ziouche, Pascale Godts, Didier Leclercq
IEEE Electron Device Letters, 2002, 23 (3), pp.139-141. ⟨10.1109/55.988817⟩. ⟨hal-00148729⟩
Measurement of the elastic and viscoelastic properties of dielectric films used in microelectronics
G. Carlotti, P. Colpani, D. Piccolo, S. Santucci, V. Senez, G. Socino, L. Verdini
Thin Solid Films, 2002, 414, pp.99-104. ⟨hal-00148744⟩
Reliability of packaging MEMS in shock environment : crack and stiction modeling
O. Millet, D. Collard, L. Buchaillot
2002, pp.696-703. ⟨hal-00148789⟩
Monte Carlo study of electron transport in InAs HEMT structures
Olivier Bonno, Jean-Luc Thobel, François Dessenne, Hervé Boutry
Proceedings of the 13th Workshop on Physical Simulation of Semiconductor Devices, 2002, Leeds, United Kingdom. ⟨hal-00148625⟩
Charge transport in some molecular devices : self-assembled molecular rectifiers and DNA molecules
D. Vuillaume
6th Conference on Molecular-Scale Electronics, 2002, Key West, FL, United States. ⟨hal-00148708⟩
Design and simulation of a two-section Fabry-Perot sampled grating distributed bragg reflector laser for dense wavelength-division multiplexing applications
M.H. Mourad, D. Marcenac, Jean-Pierre Vilcot, Didier Decoster
Optical Engineering, 2002, 41, pp.479-483. ⟨hal-00149622⟩
Mise en évidence des effets de pièges sur le comportement électrique de composants HEMTs dans la filière nitrure de gallium
M. Werquin, Christophe Gaquière, Y. Guhel, A. Minko, Virginie Hoel, D. Ducatteau, E. Delos, M.A. Poisson, F. Semond, Jean-Claude de Jaeger
3ème Ecole Thématique CNRS : Matériaux Nitrures d'Elements III, 2002, La Plagne, France. ⟨hal-00149733⟩
Les transistors à effet de champ pour l'amplification de puissance microonde : état de l'art et perspectives
Jean-Claude de Jaeger
5èmes Journées Microondes et Electromagnétisme, JMET 2002, 2002, Toulouse, France. ⟨hal-00149737⟩