Publications
Affichage de 14921 à 14930 sur 16261
Detection and characterization of underground cavities using high resolution seismic reflection (HRSR)
Lynda Driad, Bogdan Piwakowski
8. Meeting Environmental and Engineering Geophysics, Sep 2002, Aveiro, Portugal. pp.31-34. ⟨ineris-00972374⟩
Reactive ion beam etching effects on maskless PZT properties
Caroline Soyer, Eric Cattan, Denis Remiens
Integrated Ferroelectrics, 2002, 48, pp.221-229. ⟨10.1080/10584580215465⟩. ⟨hal-00149624⟩
Modélisation d'un composant à hétérostructure à transport acoustique de charges
F.E. Ratolojanahary, Tadeusz Gryba, Victor Y. Zhang, Véronique Sadaune, Jean-Etienne Lefebvre
6ème Congrès Français d'Acoustique, CFA 2002, 2002, Lille, France. pp.805-808. ⟨hal-00250198⟩
Noise modeling and measurement techniques in deep submicron SOI devices
Francois Danneville, Gilles Dambrine
Balandin A. Noise and Fluctuations Control in Electronic Devices, American Scientific Publishers, pp.355-365, 2002. ⟨hal-00577023⟩
Growth of PbTiO3/Pb[Zr,Ti]O-3 heterostructures by sputtering on Si substrate : influence of a buffer layer on the structural and electrical properties of Pb[Zr,Ti]O-3
Denis Remiens
Pandalai S.G. Crystal growth in thin solid films - Control of epitaxy, Research Signpost, Kerala, India, pp.71-86, 2002. ⟨hal-00577027⟩
0.12µm gate length In0.52Al0.48As/In0.53Ga0.47As HEMTs on transferred substrate
S. Bollaert, X. Wallart, Sylvie Lepilliet, A. Cappy, E. Jalaguier, S. Pocas, B. Aspar, J. Mateos
2002, pp.101-105. ⟨hal-00152950⟩
Transient modeling of Lamb wave generation by surface bonded piezoelectric transducers
Laurent Duquenne, Emmanuel Moulin, Jamal Assaad, Christophe Delebarre
European Workshop on Smart Structures in Engineering and Technology, May 2002, Giens, France. ⟨10.1117/12.508723⟩. ⟨hal-00149930⟩
Univariant assessment of the quality of images
M. Jung, D. Leger, Marc G. Gazalet
Journal of Electronic Imaging, 2002, 11, pp.354-364. ⟨hal-00149735⟩
Reliability of GaN based devices
G. Meneghesso, Christophe Gaquière, E. Zanoni
Proceedings of the 2002 European Microwave Week, 2002, Milano, Italy. ⟨hal-00149728⟩
Characterization of mems devices using a polarisation interferometer
D. Jenkins, W. Clegg, X. Liu, E. Fribourg-Blanc, Eric Cattan
Integrated Ferroelectrics, 2002, 50, pp.91-99. ⟨hal-00149626⟩