Publications
Affichage de 15521 à 15530 sur 16261
Experimental evaluation of new thermal inversion approach in correlation microwave thermometry
S. Bri, L. Bellarbi, M. Habibi, M. Elkadiri, A. Mamouni
Electronics Letters, 2000, 36, pp.439-440. ⟨hal-00158129⟩
Indoor propagation channel consideration in 60 GHz high data rate communications
Christophe Loyez, N. Haese, O. Lafond, P. Lefebvre, G. Lewandowski, P.A. Rolland
Proceedings of the 2000 European Conference on Wireless Technology, 2000, Paris, France. ⟨hal-00158175⟩
Dispositifs radiométriques pour usage industriel : réalisation et modélisation d'une nouvelle génération d'antenne capteur
C. Vanoverschelde
2000. ⟨hal-00158134⟩
Weighting functions for near field microwave radiometry and applications
Ahmed Mamouni, T. Lasri, Bertrand Bocquet, Y. Leroy
Proceedings of the 2000 Progress in Electromagnetics Research Symposium, PIERS 2000, Jul 2000, Cambridge, MA, United States. ⟨hal-00158174⟩
Matériaux à gap de photons reconfigurables
J. Danglot, O. Vanbésien, D. Lippens
6èmes Journées Caractérisation Microonde et Matériaux, JCMM 2000, 2000, Paris, France. ⟨hal-00158230⟩
Composition effect on the growth mode, strain relaxation and critical thickness of tensile Ga1-xInxP layers
X. Wallart, O. Schuler, D. Deresmes, F. Mollot
Applied Physics Letters, 2000, 76, pp.2080-2082. ⟨hal-00158231⟩
Data transmission using an optical microwave link for wireless communications
P. Descamps, J. Vindevoghel, E. Vestiel, Jean-Pierre Vilcot
2000, pp.1261-1264. ⟨hal-00158142⟩
A full GaAs phased-locked oscillator using sampling phase detector and sampling frequency detector
P. Lefevre, N. Haese, G. Lewandowski, Christophe Loyez, P.A. Rolland
2000, 4 pp. ⟨hal-00158148⟩
Comparison of microwave performances for fully and partially depleted sub-quarter micron SOI MOSFETs
M. Goffioul, Gilles Dambrine, D. Vanhoenacker, J.P. Raskin
Proceedings of the 5th Symposium on Diagnostics and Yield : SOI-Materials, Devices and Characterization, D&Y'2000, 2000, Warsaw, Poland. ⟨hal-00157893⟩
Issues in high frequency noise simulation for deep submicron MOSFET's
J.S. Goo, C.H. Choi, Francois Danneville, Z. Yu, T. Lee, R. Dutton
2000, pp.401-406. ⟨hal-00157897⟩