Publications
Affichage de 13291 à 13300 sur 16125
1.1 GHz silicon blade nano-electromechanical resonator featuring 20 nm gap lateral transducers
Vincent Agache, Bernard Legrand, Dominique Collard, Hiroyuki Fujita, Lionel Buchaillot
18th IEEE International Conference on Micro Electro Mechanical Systems, 2005. MEMS 2005, Jan 2005, Miami Beach, United States. pp.121-124, ⟨10.1109/MEMSYS.2005.1453882⟩. ⟨hal-00125628⟩
Explicit versus implicit finite-difference approximation for semiconductor device time-domain macroscopic numerical modelling on parallel computer
A. El Moussati, Christophe Dalle
Proceedings of the 15th Workshop on Modelling and Simulation of Electron Devices, 2005, Pisa, Italy. ⟨hal-00131335⟩
A nanofluidic electrospray source fabricated using focused ion beam etching
C. Descatoire, David Troadec, A. Ashcroft, L. Buchaillot, S. Arscott
2005, pp.241-244. ⟨hal-00130827⟩
Microsystèmes : principales applications et contexte national
L. Buchaillot, D. Collard, Bernard Legrand
Ecoles Nanosciences, 2005, Anglet, France. ⟨hal-00126216⟩
Quanti sono i principi della termodinamica ? (How many principles thermodynamics has?)
Raffaele Pisano
La fisica nella scuola , XL (3), pp.203-211, 2005, Proceedings of XLIII AIF National Congress. ⟨hal-04515042⟩
Compensation par conception de la dilatation thermique de micro-interrupteurs RF
Quynh Huong Duong, Xavier Lafontan, Dominique Collard, Lionel Buchaillot, Petra Schmitt, Patrick Pons, F. Pressecq
17e Congrès Français de Mécanique, 2005, Troyes, France. ⟨hal-04270490⟩
High performances of InP channel power HEMT at 94 GHz
F Medjdoub, M. Zaknoune, X. Wallart, Christophe Gaquière, D. Theron
Electronics Letters, 2005, 41, pp.1406-1408. ⟨hal-00154912⟩
Terahertz emission from nanometric HEMTs analyzed by noise spectra
J.F. Millithaler, L. Varani, C. Palermo, J. Mateos, T. Gonzalez, S. Perez, D. Pardo, W. Knap, J. Lusakowski, N. Dyakonova, S. Bollaert, A. Cappy
Terahertz emission from nanometric HEMTs analyzed by noise spectra, 2005, Salamanca, Spain. pp.335-338, ⟨10.1063/1.2036763⟩. ⟨hal-00154896⟩
Ultrasonic evaluation of residual stress in flat glass tempering by an original double interferometric detection
D. Devos, Marc Duquennoy, E. Romero, Frédéric Jenot, Dominique Lochegnies, Mohammadi Ouaftouh, Mohamed Ourak
Proceedings of the 2005 Joint World Congress on Ultrasonics/Ultrasonics International, WCU/UI'05, 2005, Beijing, China. ⟨hal-00140793⟩