Publications
Affichage de 14251 à 14260 sur 16434
Technique de déconvolution aveugle appliquée au contrôle non destructif par micro-ondes
D. Glay, T. Lasri
PLACKO D., ORTEU J.J., LEPOUTRE F. Instrumentation - Aspects fondamentaux, Hermès, pp.189-196, 2004. ⟨hal-00132298⟩
Noise modeling and performance of SOI MOSFETs
Francois Danneville, G. Pailloncy, B. Iniguez, J.P. Raskin, Gilles Dambrine
IEEE MTT-S International Microwave Symposium, Workshop on High Frequency Noise in Advanced Silicon-based Devices : From Basics to State-of-the-Art Device and Circuit Performances, 2004, Fort Worth, TX, United States. ⟨hal-00133912⟩
Influence of a tunneling gate current on the noise performance of SOI MOSFETs
G. Pailloncy, B. Iniguez, Gilles Dambrine, Francois Danneville
2004, pp.55-57. ⟨hal-00133883⟩
Thermal de-embedding procedure for cryogenic on-wafer high frequency noise measurement
S. Delcourt, Gilles Dambrine, Nour Eddine Bourzgui, Francois Danneville, C. Laporte, J.P. Fraysse, M. Maignan
2004, pp.414-421. ⟨hal-00133897⟩
Multimode underwater transducers
R.E. Newnham, D.C. Markley, R.J. Meyer, W.J. Hughes, Anne-Christine Hladky, J. Cochran
Symposium on Ceramic Materials and Multilayer Electronic Devices, Apr 2003, Nashville, TN, United States. pp.427-443. ⟨hal-00133853⟩
Strong picosecond ultrasonic responses of semiconductors probed close to interband transitions
R. Cote, Arnaud Devos
2004, pp.2741-2744. ⟨hal-00133845⟩
Design optimization of AlInAs-GaInAs HEMTs for high frequency applications
J. Mateos, T. Gonzales, D. Pardo, S. Bollaert, T. Parenty, A. Cappy
IEEE Transactions on Electron Devices, 2004, 51, pp.521-528. ⟨hal-00133866⟩
Acoustique picoseconde : une technique originale de caractérisation des films minces
Arnaud Devos
Rôle des contraintes dans les Micro- et Nano-technologies, 2004, Meylan, France. ⟨hal-00133855⟩
Two Young modulus of Pb(Zr,Ti)03 thin films measured by nanoindentation
Patrick Delobelle, Olivier Guillon, E. Fribourg-Blanc, Caroline Soyer, Eric Cattan, Denis Remiens
Applied Physics Letters, 2004, 85(22), pp. 1-3. ⟨hal-00019767⟩
Sur la signification des valeurs du module d'Young déterminé par nanoindentation dans le cas des matériaux ferroélectriques
Patrick Delobelle, Olivier Guillon, E. Fribourg-Blanc, Caroline Soyer, Denis Remiens
2004. ⟨hal-00020033⟩