Publications

• Communication dans un congrès

Reliability of packaging MEMS in shock environment : crack and stiction modeling

O. Millet, D. Collard, L. Buchaillot

2002, pp.696-703. ⟨hal-00148789⟩

• Communication dans un congrès

Grazing incidence diffraction anomalous fine structure of self-assembled semiconductor nanostructures

S. Grenier, A. Letoublon, M.G. Proietti, Hubert Renevier, L. Gonzalez, J.M. Garcia, C. Priester, J. Garcia

2002, pp.24-33. ⟨hal-00149685⟩

• Communication dans un congrès

Beam forming through the use of electromagnetic band gap materials

Tahsin Akalin, G. Wolf, S. Arscott, Xavier Mélique, Olivier Vanbésien, Eric Estebe, Didier Lippens

25th ESA Antenna Workshop, 2002, Noordwijk, Netherlands. ⟨hal-00148652⟩

• Communication dans un congrès

Emission basse fréquence par interaction non-linéaire d'ondes ultrasonores

Philippe Pernod, Y. Pylnov, Vladimir Preobrazhensky

Actes du 6ème Congrès Français d'Acoustique, CFA 2002, 2002, Lille, France. ⟨hal-00148704⟩

• Autre publication scientifique

Microcapteurs de rayonnement infrarouge en technologie silicium

Mohamed Boutchich

2002. ⟨hal-00148731⟩

• Communication dans un congrès

Monte Carlo study of electron transport in InAs HEMT structures

Olivier Bonno, Jean-Luc Thobel, François Dessenne, Hervé Boutry

Proceedings of the 13th Workshop on Physical Simulation of Semiconductor Devices, 2002, Leeds, United Kingdom. ⟨hal-00148625⟩

• Communication dans un congrès

Fabrication and characterization of laterally coupled lasers

S. Mc Murtry, Jean-Pierre Vilcot, F. Mollot, Didier Decoster

2002, pp.367-374. ⟨hal-00149638⟩

• Communication dans un congrès

MIMO propagation channel models in underground environment

J.F. Pardonche, M. Berbineau, C. Seguinot, M. Lienard

2002, pp.Session SunPmOR1, 1-6. ⟨hal-00149644⟩

• Article dans une revue

Measurement of the elastic and viscoelastic properties of dielectric films used in microelectronics

G. Carlotti, P. Colpani, D. Piccolo, S. Santucci, V. Senez, G. Socino, L. Verdini

Thin Solid Films, 2002, 414, pp.99-104. ⟨hal-00148744⟩

• Article dans une revue

Characterization of phosphorus and boron heavily doped LPCVD polysilicon films in the temperature range 293-373K

Mohamed Boutchich, Katir Ziouche, Pascale Godts, Didier Leclercq

In this paper, thermal properties of phosphorus and boron-doped low pressure chemical vapor deposition (LPCVD) polysilicon layers with regard to sensor applications are presented. Thermoelectric coefficient and relative resistance variations of polysilicon are investigated within the temperature…

IEEE Electron Device Letters, 2002, 23 (3), pp.139-141. ⟨10.1109/55.988817⟩. ⟨hal-00148729⟩