Publications

Affichage de 7731 à 7740 sur 16120


  • Communication dans un congrès

Low loss terahertz planar Goubau line on high resistivity silicon substrate

Mokhtar Zehar, Gabriel Moreno, Abdallah Chahadih, Ibrahim Türer, Abbas Ghaddar, Tahsin Akalin

Improvement of THz waveguides with reduced losses has seen a rapid progress in the recent years. Among designs with the low loss, Planar Goubau Line have been designed and fabricated on high resistivity silicon substrate. In this contribution, we discuss two kinds of Planar Goubau lines:…

13th Mediterranean Microwave Symposium, MMS 2013, Sep 2013, Saida, Lebanon. 3 p., ⟨10.1109/MMS.2013.6663115⟩. ⟨hal-00914241⟩

  • Communication dans un congrès

High-transparency metal mesh filters based on cyclic olefin copolymer films for broadband THz applications

F. Pavanello, M.B. Kuppam, F. Garet, Emilien Peytavit, M. Vanwolleghem, Francois Vaurette, J.L. Coutaz, Jean-Francois Lampin

38th International Conference on Infrared, Millimeter and Terahertz Waves, IRMMW-THz 2013, 2013, Mainz, Germany. paper TH2-3, 2 p., ⟨10.1109/IRMMW-THz.2013.6665877⟩. ⟨hal-00914240⟩

  • Article dans une revue

[Invited] Stabilization and mode locking of terahertz quantum cascade lasers

M. Ravaro, P. Gellie, G. Santarelli, C. Manquest, P. Filloux, C. Sirtori, Jean-Francois Lampin, G. Ferrari, S.P. Khanna, E.H. Linfield, H.E. Beere, D.A. Ritchie, S. Barbieri

IEEE Journal of Selected Topics in Quantum Electronics, 2013, 19, pp.8501011-1-11. ⟨10.1109/JSTQE.2012.2212003⟩. ⟨hal-00829875⟩

  • Communication dans un congrès

Graphène artificiel à fort couplage spin-orbite formé par auto-assemblage de nanocristaux de semiconducteurs

Efterpi Kalesaki, Mark Pieter Boneschanscher, Jaco J. Geuchies, Christophe Delerue, Cristiane Morais Smith, Wiel H. Evers, Guy Allan, Thomas Altantzis, Sara Bals, Daniel Vanmaekelbergh

Journées Boîtes Quantiques 2013, JBQ 2013, 2013, Paris, France. ⟨hal-00922582⟩

  • Communication dans un congrès

Nanoscale capacitors study with an interferometric scanning microwave microscope

Fei Wang, Nicolas Clément, David Troadec, Bernard Legrand, Gilles Dambrine, Didier Theron

Electrical impedance characterization at the nanoscale is a challenge for beyond CMOS investigations and for understanding the electronic properties of nanomaterials. Among the various scanning probe microscopes, Scanning Microwave Microscope (SMM) is of particular interest because it combines…

Materials Research Society Fall Meeting, MRS Fall 2013, Symposium LL : Advances in Scanning Probe Microscopy, 2013, Boston, MA, United States. ⟨hal-00944017⟩

  • Communication dans un congrès

Low-IQ : MMIC ultra faible consommation cryogénique et ambiant pour télécommunications spatiales en bande Q

S. Bollaert, Francois Danneville, Yannick Roelens, L. Desplanque, Cyrille Gardes, Sonia Bagumako, Cédric Chambon, Benoît Fauroux, Jean-Philippe Fraysse, Patrice Régnier, Michel Maignan, Peter Friijlink, Rémy Leblanc, Marc Marilier

Les Rencontres du Numérique, 2013, Paris, France. ⟨hal-00974542⟩