Publications
Affichage de 15641 à 15650 sur 16440
Microtechnologies for the monolithic fabrication of mm and submm nonlinear devices
P. Mounaix, S. Arscott, T. David, Florence Podevin, X. Melique, D. Lippens
2000, pp.28-31. ⟨hal-00158204⟩
High Q InP-based varactor diodes
T. David, P. Mounaix, X. Melique, F. Mollot, O. Vanbésien, M. Chaubet, D. Lippens
Proceedings of the 11th International Symposium on Space Terahertz Technology, 2000, Ann Arbor, MI, United States. ⟨hal-00158223⟩
Détection par micro-ondes de défauts dans les matériaux diélectriques
D. Glay, T. Lasri, A. Mamouni, Y. Leroy
6èmes Journées Caractérisation Microondes et Matériaux, JCMM 2000, 2000, Paris, France. ⟨hal-00158162⟩
Towards terahertz circuits via InP micromachining techniques
S. Arscott, T. David, X. Melique, P. Mounaix, D. Lippens
2000, pp.561-564. ⟨hal-00158203⟩
Resonant and localized electromagnetic modes in finite superlattices
M. Lahlaouti, Abdellatif Akjouj, B. Djafari-Rouhani, Leonard Dobrzynski
Physical Review B, 2000, 61 (3), pp.2059-2064. ⟨10.1103/PhysRevB.61.2059⟩. ⟨hal-04070077⟩
Finite element modeling of damping using piezoelectric materials
Anne-Christine Hladky, C. Granger
2000, pp.64-65. ⟨hal-00157823⟩
Ultrasonic cavitation monitoring by acoustic noise power measurement
J. Frohly, S. Labouret, C. Bruneel, I. Looten-Baquet, R. Torguet
Journal of the Acoustical Society of America, 2000, 108, pp.2012-2020. ⟨hal-00159071⟩
Conical radiating waves in immersed wedges
Anne-Christine Hladky, P. Langlet, M. de Billy
Journal of the Acoustical Society of America, 2000, 108, pp.3079-3083. ⟨hal-00157821⟩
Modeling of Lamb waves generated by integrated transducers in composite plates using a coupled finite element-normal modes expansion method
Emmanuel Moulin, Jamal Assaad, Christophe Delebarre, D. Osmont
Journal of the Acoustical Society of America, 2000, 107, pp.87-94. ⟨hal-00159070⟩
Caractérisation des tumeurs du sein par imagerie radiométrique microonde
Bertrand Bocquet, Y. Leroy, Ahmed Mamouni, N. Rocourt, Patrick Devos, Y. Robert
6èmes Journées Caractérisation Microonde et Matériaux, JCMM 2000, 2000, Paris, France. ⟨hal-00158168⟩