Publications
Affichage de 16071 à 16080 sur 16551
Microscopic characterization of defects using scanning tunneling microscopy
D. Stievenard
Materials Science and Engineering: B, 2000, B71, pp.120-127. ⟨hal-00158667⟩
Microtechnologies for the monolithic fabrication of mm and submm nonlinear devices
P. Mounaix, S. Arscott, T. David, Florence Podevin, X. Melique, D. Lippens
2000, pp.28-31. ⟨hal-00158204⟩
High Q InP-based varactor diodes
T. David, P. Mounaix, X. Melique, F. Mollot, O. Vanbésien, M. Chaubet, D. Lippens
Proceedings of the 11th International Symposium on Space Terahertz Technology, 2000, Ann Arbor, MI, United States. ⟨hal-00158223⟩
Détection par micro-ondes de défauts dans les matériaux diélectriques
D. Glay, T. Lasri, A. Mamouni, Y. Leroy
6èmes Journées Caractérisation Microondes et Matériaux, JCMM 2000, 2000, Paris, France. ⟨hal-00158162⟩
Towards terahertz circuits via InP micromachining techniques
S. Arscott, T. David, X. Melique, P. Mounaix, D. Lippens
2000, pp.561-564. ⟨hal-00158203⟩
Resonant and localized electromagnetic modes in finite superlattices
M. Lahlaouti, Abdellatif Akjouj, B. Djafari-Rouhani, Leonard Dobrzynski
Physical Review B, 2000, 61 (3), pp.2059-2064. ⟨10.1103/PhysRevB.61.2059⟩. ⟨hal-04070077⟩
Finite element modeling of damping using piezoelectric materials
Anne-Christine Hladky, C. Granger
2000, pp.64-65. ⟨hal-00157823⟩
Deep traps related effects in GaN MESFET's grown on saphire substrate
A. Chini, G. Meneghesso, E. Zanoni, M. Manfredi, M. Pavesi, B. Boudart, Christophe Gaquière
10th European Workshop on Heterostructure Technology, HeTech 2000, 2000, Ulm, Germany. ⟨hal-00159037⟩
Dry etching for gate recessing on AlGaN/GaN HEMTs
Y. Guhel, B. Boudart, M.A. Poisson, Jean-Claude de Jaeger
10th European Workshop on Heterostructure Technology, HeTech 2000, 2000, Ulm, Germany. ⟨hal-00159034⟩