Publications

Affichage de 6891 à 6900 sur 16278


  • Communication dans un congrès

Atomic scale simulation of Si/SiO2 boundary conductance

Pierre-Arnaud Francioso, Pier Luca Palla, Evelyne Lampin, Fabrizio Cleri

Poor heat dissipation in Si-based nanodevices is an issue for their development. Most of these nanodevices are fabricated using SOI to benefit from the electrical isolation between devices provided by the burried oxyde (BOX). The top silicon layer is also easily processed to form the nanostructure…

European Materials Research Society Spring Meeting, E-MRS Spring 2014, Symposium X - Materials research for group IV semiconductors : growth, characterization and technological developments, 2014, Lille, France. ⟨hal-00961391⟩

  • Communication dans un congrès

Nonlinear measurement dedicated to non periodic pulse train for radar power amplifier characterization

Vincent Bridier, Damien Ducatteau, M. Olivier, Hans-Joachim Simon, François Graux, Philippe Eudeline, Gilles Dambrine

A six port mixer based 20GHz nonlinear vector network analyzer (NVNA) dedicated to the characterization of radar power amplifier driven by non periodic pulsed signal is proposed. For the first time a mixer based NVNA is able to measure the fundamental and two harmonics simultaneously while using…

62nd IEEE MTT-S International Microwave Symposium, IMS 2014, 2014, Tampa, FL, United States. paper THP-26, 4 p., ⟨10.1109/MWSYM.2014.6848400⟩. ⟨hal-01044723⟩

  • Communication dans un congrès

[Invited] Millimeter-wave noise and power characterization using in situ tuner

Thomas Quemerais, Daniel Gloria, Sandrine Oeuvrard, Christophe Gaquière, Francois Danneville, Gilles Dambrine, Marina Deng

The advanced micro-and nano-technologies now allows the design of high frequencies integrated circuit with transistors operating at millimeter-wave (MMW) frequencies and beyond. This evolution led us to develop industrial test tools to characterize and validate the models of these transistors.…

62nd IEEE MTT-S International Microwave Symposium, IMS 2014, Workshop WMI - Challenges and advances in wafer-level calibration and characterization of millimeter and sub-millimeter wave devices and systems, 2014, Tampa, FL, United States. ⟨hal-01044780⟩

  • Article dans une revue

A simple and inexpensive technique for PDMS/silicon chip alignment with sub-µm precision

R. Sivakumarasamy, K. Nishiguchi, A. Fujiwra, Dominique Vuillaume, N. Clement

Analytical Methods, 2014, 6, pp.97-101. ⟨10.1039/c3ay41618f⟩. ⟨hal-00916286⟩

  • Autre publication scientifique

Advances in Historical Studies [Editor in Chief 3/5]

Raffaele Pisano

2014. ⟨hal-04511043⟩