Publications

Affichage de 7061 à 7070 sur 16279


  • Communication dans un congrès

Electro-optic and converse piezoelectric coefficients of epitaxial thin films : GaN grown on Si, and (Sr,Ba)Nb2O6 (SBN) grown on Pt coated MgO (poster)

Mireille Cuniot-Ponsard, Irma Saraswati, Suk-Min Ko, Mathieu Halbwax, Yong-Hoon Cho, El Hadj Dogheche

We report the first measurement of the (r13, r33) Pockels electro-optic coefficients in a SBN thin film and in a GaN thin film grown on silicon. The converse-piezoelectric and electro-absorptive coefficients are simultaneously determined.

Conference on Lasers and Electro-Optics, CLEO 2014, Laser Science to Photonic Applications, 2014, San Jose, CA, United States. ⟨hal-00975792⟩

  • Communication dans un congrès

Electromechanical and electro-optical properties of PEDOT based IPNs

Frederic Vidal, Cedric Plesse, Pierre-Henri Aubert, Eric Cattan, Caroline Soyer, Jean-Paul Dudon, Dominique Teyssie, Claude Chevrot, Giao T M Nguyen

SPIE Smart Structures/NDE 2014, Conference 9056 - Electroactive Polymer Actuators and Devices (EAPAD) XVI, 2014, San Diego, CA, United States. ⟨hal-00974544⟩

  • Article dans une revue

Temperature dependence of the conduction mechanisms through a Pb(Zr,Ti)O3 thin film

C. Jegou, L. Michalas, T. Maroutian, G. Agnus, M. Koutsoureli, G. Papaioannou, L. Largeau, David Troadec, A. Leuliet, P. Aubert, P. Lecoeur

The conduction mechanisms through a lead zirconate titanate (PZT) thin film grown by pulsed laser deposition with a La0.67Sr0.33MnO3 (LSMO) buffer layer on epitaxial Pt (111) were assessed in the 230-330 K temperature range. X-Ray diffraction and transmission electron microscopy evidenced a…

Thin Solid Films, 2014, 563, pp.32-35. ⟨10.1016/j.tsf.2013.12.043⟩. ⟨hal-01009981⟩

  • Communication dans un congrès

Matériaux lithiés obtenus par dépôt physique et chimique en phase vapeur pour microbatterie Li-ion

Manon Letiche, Etienne Eustache, Pascal Roussel, Christophe Lethien

Journées Nord-Ouest Européennes des Jeunes Chercheurs, JNOEJC 2014, 2014, Villeneuve d'Ascq, France. ⟨hal-01009970⟩

  • Communication dans un congrès

Electrical characterization of semiconductor nanowires by scanning tunneling microscopy

Corentin Durand, Pierre Capiod, Maxime Berthe, Tao Xu, Jean-Philippe Nys, Renaud Leturcq, Philippe Caroff, B. Grandidier

In order to understand the structural and electronic properties of semiconductor nanowires, scanning tunneling microscopy is an appealing technique that can supplement transmission electron microscopies and conventional electrical characterization techniques. It is able to probe the surface of…

SPIE Photonics West, OPTO, Conference 8996 - Quantum Dots and Nanostructures : Synthesis, Characterization, and Modeling XI, 2014, San Francisco, CA, United States. 89960E, 10 p., ⟨10.1117/12.2042767⟩. ⟨hal-00974539⟩