Publications
Affichage de 10721 à 10730 sur 16278
Double réflectomètre millimétrique six-port
Kamel Haddadi, M.M. Wang, D. Glay, K. Ziouche, T. Lasri
16èmes Journées Nationales Microondes, JNM 2009, 2009, France. pp.6D-7, 1-4. ⟨hal-00573521⟩
Systèmes multi-port hyperfréquences et techniques de calibrage associées
Kamel Haddadi, D. Glay, T. Lasri
Assemblée Générale du GDR Interférences d'Ondes, 2009, Châtillon, France. pp.218-219. ⟨hal-00573534⟩
Comment franchir le gap des térahertz ?
Jean-Francois Lampin
16èmes Journées Nationales Microondes, JNM 2009, 2009, France. pp.Inv-8, 1-3. ⟨hal-00573508⟩
Ewod displacement on patterned superhydrophobic silicon nanowires surface : lab-on-chip for direct mass spectrometry analysis
F. Lapierre, G. Piret, N. Verplanck, V. Thomy, R. Boukkerroub
12èmes Journées Nationales du Réseau Doctoral de Microélectronique, JNRDM 2009, 2009, Lyon, France. ⟨hal-00575731⟩
Synthesis and characterization of (Na0.5Bi0.5)TiO3 (NBT) thin films
S. Quignon, Caroline Soyer, Denis Remiens
European Materials Research Society Spring Meeting, E-MRS Spring 2009, Symposium G : Fundamentals and technology of multifunctional oxide thin films, 2009, Strasbourg, France. ⟨hal-00575743⟩
Terahertz plasmonics and metaplasmonics
Tahsin Akalin
Asia Pacific Microwave Conference, APMC 2009, Dec 2009, Singapore, Singapore. ⟨hal-00575700⟩
Acousto-optical equalizer for WDM systems of optical communications
Konstantin B. Yushkov, Jean-Claude Kastelik, Samuel Dupont, V.B. Voloshinov
XII International Conference on Wave Electronics and Its Applications in Information and Telecommunication Systems, 2009, St Petersburg, Russia. ⟨hal-00575273⟩
Towards High Qualification for Science Education. The Loss of Certainty [Editorial]
Raffaele Pisano
Journal of Baltic Science Education, 2009, 8 (2), pp.64-68. ⟨hal-04509620⟩
Micro-systèmes et contrôle d'écoulements
Alain Merlen, Philippe Pernod, Abdelkrim Talbi, Romain Viard, Leticia Gimeno
CFM 2009 - 19ème Congrès Français de Mécanique, Aug 2009, Marseille, France. ⟨hal-03390896⟩
UHV fabrication of the ytterbium silicide as potential low schottky barrier S/D contact material for N-type MOSFET
Dmitri Yarekha, G. Larrieu, N. Breil, Emmanuel Dubois, S. Godey, X. Wallart, Caroline Soyer, Denis Remiens, N. Reckinger, Xing Tang, A. Laszcz, J. Ratajczak, A. Halimaoui
ECS Transactions, 2009, 19, pp.339-344. ⟨10.1149/1.3118961⟩. ⟨hal-00471999⟩