Publications
Affichage de 11411 à 11420 sur 16279
RF small signal analysis of Schottky-barrier p-MOSFETs
R. Valentin, Emmanuel Dubois, J.P. Raskin, G. Larrieu, Gilles Dambrine, T.C. Lim, N. Breil, Francois Danneville
IEEE Transactions on Electron Devices, 2008, 55, pp.1192-1202. ⟨10.1109/TED.2008.919382⟩. ⟨hal-00356664⟩
Geophysical detection of underground cavities
Lynda Driad-Lebeau, Bogdan Piwakowski, Peter Styles, Bernard Bourgeois, Isabelle Contrucci
Symposium Post-Mining 2008, Feb 2008, Nancy, France. pp.NC. ⟨ineris-00973287⟩
Etude des effets parasites dans les transistors à haute mobilité à base de nitrure : HEMT AlGaN/GaN
M. Gassoumi, O. Fathallah, Christophe Gaquière, G. Guillot, H. Maaref
11èmes Journées Maghrébines des Sciences de Matériaux, JMSM 2008, 2008, Hammamet, Tunisie. ⟨hal-00811731⟩
[Invited] Nonlinear magnetoacoustics of solids
Vladimir Preobrazhensky
Linear and Nonlinear Acoustic Wave Propagation in Heterogeneous Media : Modern Trends and Applications, 2008, Les Houches, France. ⟨hal-00811713⟩
Micro ripples, sand ripples and their universal wavelength scaling
P.J. Thomas, Farzam Zoueshtiagh, A. Merlen, V. Thomy
7th EUROMECH Fluid Mechanics Conference, EFMC7, 2008, Manchester, United Kingdom. ⟨hal-00811718⟩
THz emission from AlGaN/GaN high mobility transistors
N. Dyakonova, D. Coquillat, F. Teppe, W. Knap, M.E. Levinshtein, S.L. Rumyantsev, M.A. Poisson, S. Delage, Christophe Gaquière, S. Vandenbrouck, A. Cappy
V International Conference 'Basic Problems of Optics', 2008, St Petersburg, Russia. ⟨hal-00811735⟩
Structural control of the horizontal double fixation of oligothiophenes on gold
T.K. Tran, M. Oçafrain, S. Karpe, P. Blanchard, J. Roncali, S. Lenfant, S. Godey, D. Vuillaume
Chemistry - A European Journal, 2008, 14, pp.6237-6246. ⟨10.1002/chem.200800133⟩. ⟨hal-00357296⟩
InP/benzocyclobutene optical nanowires
Michèle Carette, Jean-Pierre Vilcot, D. Bernard, Didier Decoster
Electronics Letters, 2008, 44, pp.902-903. ⟨10.1049/el:20081169⟩. ⟨hal-00357307⟩
Impact of lateral asymmetry of MOSFETs on the gate-drain noise correlation
A.S. Roy, C.C. Enz, T.C. Lim, Francois Danneville
IEEE Transactions on Electron Devices, 2008, 55, pp.2268-2272. ⟨10.1109/TED.2008.925935⟩. ⟨hal-00356669⟩
High-frequency noise performance of 60-nm gate-length FinFETs
J.P. Raskin, G. Pailloncy, D. Lederer, Francois Danneville, Gilles Dambrine, S. Decoutere, A. Mercha, B. Parvais
IEEE Transactions on Electron Devices, 2008, 55, pp.2718-2727. ⟨10.1109/TED.2008.2003097⟩. ⟨hal-00356670⟩