Publications
Affichage de 11631 à 11640 sur 16261
Silicon on nothing MEMS electromechanical resonator
C. Durand, F. Casset, P. Ancey, F. Judong, A. Talbot, R. Quenouillere, D. Renaud, S. Borel, B. Florin, L. Buchaillot
Microsystem Technologies, 2008, 14, pp.1027-1033. ⟨10.1007/s00542-007-0485-z⟩. ⟨hal-00357280⟩
Surface potential of n- and p-type GaN measured by Kelvin force microscopy
Sophie Barbet, Raphaël Aubry, Marie-Antoinette Di Forte-Poisson, Jean-Claude Jacquet, D. Deresmes, Thierry Melin, Didier Theron
Applied Physics Letters, 2008, 93, pp.212107-1-3. ⟨10.1063/1.3028639⟩. ⟨hal-00357781⟩
Preliminary investigations on the Te-doped AlInSb/GaInSb heterostructures for High Electron Mobility Transistor (HEMT) applications
L. Delhaye, L. Desplanque, X. Wallart
IEEE 20th Conference on Indium Phosphide and Related Materials, IPRM'08, 2008, France. pp.1-3, ⟨10.1109/ICIPRM.2008.4702932⟩. ⟨hal-00360480⟩
Measurement (1/f noise, RTS) in molecular junction
N. Clément, S. Pleutin, O. Seitz, David Guérin, S. Lenfant, D. Cahen, D. Vuillaume
Indo-French Workshop on Multifunctional Molecular and Hybride Devices, 2008, Saclay, France. ⟨hal-00361584⟩
Etude des mécanismes de la croissance et du dopage de nanofils de silicium
W. M. Chen, P. Pareige, E. Cadel, R. Larde, T. Xu, B. Grandidier, D. Stievenard
1ères Journées Nanosciences Nord-Ouest, J2NO 2008, 2008, Poitiers, France. ⟨hal-00361981⟩
Electrostatic properties of carbon nanotubes and CNT-based devices using scanning force techniques
Thierry Melin
Indo-French Workshop on Multifunctional Molecular and Hybride Devices, 2008, Saclay, France. ⟨hal-00361977⟩
Characterization of nanogap chemical reactivity using peptide-capped gold nanoparticles and electrical detection
L. Marcon, D. Stiévenard, O. Melnyk
30th European Peptide Symposium, 30EPS, 2008, Helsinki, Finland. ⟨hal-00362013⟩
Frequency behavior in pentacene MIS capacitors
C. Petit, D. Zander, K. Lmimouni, M. Ternisien, S. Lenfant, D. Vuillaume
4th International Meeting on Molecular Electronics, ElecMol'08, 2008, Grenoble, France. ⟨hal-00361618⟩
Transmission electron microscopy study of erbium silicide formation from Ti/Er stack for Schottky contact applications
J. Ratajczak, A. Laszcz, A. Czerwinski, J. Katcki, F. Phillipp, P.A. van Aken, N. Reckinger, Emmanuel Dubois
XIII International Conference on Electron Microscopy, EM'2008, 2008, Cracow-Zakopane, Poland. ⟨hal-00361544⟩
Investigation of the ytterbium silicide as low Schottky barrier source/drain contact material for n-type MOSFET
Dmitri Yarekha, G. Larrieu, Emmanuel Dubois, S. Godey, X. Wallart, Caroline Soyer, Denis Remiens, N. Reckinger, Xing Tang, A. Laszcz, J. Ratajczak
Journées Nationales sur les Technologies Emergentes en Micro-nanofabrication, JNTE 08, 2008, Toulouse, France. ⟨hal-00361550⟩