Publications

• Communication dans un congrès

Experimental observation of nonlinear self-focusing in the cavitation field

C. Campos-Pozuelo, C. Vanhille, Bertrand Dubus

19th International Congress on Acoustics, ICA 2007, 2007, Madrid, Spain. ⟨hal-00286232⟩

• Communication dans un congrès

CardioSense3D: Patient-Specific Cardiac Simulation

Hervé Delingette, Maxime Sermesant, Jean-Marc Peyrat, Nicholas Ayache, Kawal S. Rhode, Reza Razavi, Elliot R. Mcveigh, Dominique Chapelle, Jacques Sainte-Marie, Philippe Moireau, Miguel Angel Fernández, Jean-Frédéric Gerbeau, K. Djabella, Q. Zhang, Michel Sorine

no abstract

Proceedings of IEEE International Conference on Biomedical Imaging: From Nano to Macro (ISBI'07), 2007, Metro Washington DC, USA, United States. pp.628-631. ⟨inria-00616052⟩

• Communication dans un congrès

Study of functional behaviour of an electronic system placed in hostile electromagnetic environment

L. Guibert, I. Junqua

Proceedings of the 2007 EMC Europe Workshop, 2007, Paris, France. ⟨hal-00369930⟩

• Article dans une revue

Low frequency noise in InAlAs/InGaAs modulation doped field effect transistors with 50-nm gate length

M.E. Levinshtein, S.L. Rumyantsev, R. Tauk, S. Boubanga, N. Dyakonova, W. Knap, A. Shchepetov, S. Bollaert, Yannick Roelens, M.S. Shur

Journal of Applied Physics, 2007, 102 (6), pp.064506. ⟨10.1063/1.2781087⟩. ⟨hal-00283040⟩

• Article dans une revue

On-line tools for microscopic and macroscopic monitoring of microwave processing

S. Vaucher, P. Unifantowicz, C. Ricard, Luc Dubois, M. Kuball, J.-M. Catala-Civera, Dominique Bernard, M. Stampanoni, R. Nicula

Direct monitoring of temperature, chemistry and microstructure is required to understand microwave heating in more detail, in order to fully exploit the unique features this non-equilibrium processing method can offer. In this paper, we show first that microwave radiometry can be used to follow…

Physica B: Condensed Matter, 2007, 398 (2), pp.191-195. ⟨10.1016/j.physb.2007.04.064⟩. ⟨hal-00179746⟩

• Article dans une revue

Comparison of structural and electrical properties of PMN-PT films deposited on Si with different bottom electrodes

M. Detalle, Gang Wang, Denis Remiens, P. Ruterana, P. Roussel, B. Dkhil

PMN-PT (70/30) thin films were deposited by sputtering on silicon substrate covered with different bottom electrodes: TiOx/Pt and LaNiO3 (LNO). The bilayers TiOx/Pt are deposited by sputtering and the LNO layer by sol–gel. Whatever the bottom electrodes the perovskite phase appears at 400 °C; the…

Journal of Crystal Growth, 2007, 305 (1), pp.137-143. ⟨10.1016/j.jcrysgro.2007.04.020⟩. ⟨hal-00176607⟩

• Article dans une revue

Wide-band acousto-optic deflectors with high efficiency for visible range fringe pattern projector

Samuel Dupont, Jean-Claude Kastelik, F. Causa

Review of Scientific Instruments, 2007, 78, pp.105102-1-4. ⟨10.1063/1.2793775⟩. ⟨hal-00255746⟩

• Article dans une revue

Silicon-molecules-metal junctions by transfert printing : chemical synthesis and electrical properties

David Guérin, C. Merckling, S. Lenfant, X. Wallart, S. Pleutin, D. Vuillaume

Journal of Physical Chemistry C, 2007, 111, pp.7947-7956. ⟨10.1021/jp067846v⟩. ⟨hal-00255833⟩

• Article dans une revue

Complete system for wireless powering and remote control of electrostatic actuators by inductive coupling

Philippe Basset, A. Kaiser, Bernard Legrand, D. Collard, L. Buchaillot

IEEE/ASME Transactions on Mechatronics, 2007, 12, pp.23-31. ⟨10.1109/TMECH.2006.886245⟩. ⟨hal-00255847⟩

• Article dans une revue

Energy transfer between semiconductor nanocrystals : validity of Förster's theory

Guy Allan, Christophe Delerue

We theoretically study the energy transfer between semiconductor nanocrystals and we calculate the rate of this process in the case of direct-gap (InAs) and indirect-gap (Si) semiconductors. The calculations are based on the tight-binding method that enables us to determine the transfer rate,…

Physical Review B: Condensed Matter and Materials Physics (1998-2015), 2007, 75, pp.195311. ⟨10.1103/PhysRevB.75.195311⟩. ⟨hal-00283123⟩