Publications
Affichage de 12551 à 12560 sur 16059
Inclusions detection using Lamb waves in flexible printed circuits
Frédéric Jenot, Mohammadi Ouaftouh, Wei-Jiang Xu, Marc Duquennoy, Mohamed Ourak
Ultrasonics, 2006, 44, pp.1163-1167. ⟨hal-00138721⟩
One-bit correlator receiver and averaging-oversampling effects
B. El Khaldi, Jean-Michel Rouvaen, Atika Rivenq, Yassin El Hillali
Digital Signal Processing, 2006, 16, pp.120-136. ⟨hal-00138725⟩
Large optimisation of source/drain architecture in double gate CMOS using combined static and transient analysis
Christophe Krzeminski, Emmanuel Dubois
Materials Research Society Spring Meeting, MRS Spring 2006, Transistor Scaling - Methods, Materials, and Modeling, 2006, Moscone West, San-Franscico, CA, United States. ⟨hal-00138694⟩
Contributions à la conception et à la réalisation de transistors MOS à grille multiple
J. Penaud
2006. ⟨hal-00138699⟩
Communications sur le réseau d'énergie électrique d'un véhicule : modélisation et analyse du canal de propagation
M. Olivas-Carrion
2006. ⟨hal-00140177⟩
Vers une interprétation physique de la propagation d'onde sur une surface rugueuse
B. Morvan, Anne-Christine Hladky, M. Bavencoffe, D. Leduc, Catherine Potel, J.L. Izbicki
2006, pp.131-134. ⟨hal-00140158⟩
Enhanced protein capture by ultrafast SAW droplet micromixing
E. Galopin, A. Renaudin, V. Thomy, J.C. Camart, P. Tabourier, C. Druon
2006, pp.651-653. ⟨hal-00140372⟩
Caractérisation de nanofils de Si par sonde atomique tomographique
R. Lardé, J. Houard, E. Cadel, P. Pareige, D. Hourlier, D. Stievenard
10èmes Journées de la Matière Condensée, 2006, Toulouse, France. ⟨hal-00243976⟩
Plasma wave HEMTs for THz applications
A. Shchepetov, Yannick Roelens, S. Bollaert, A. Cappy, N. Dyakonova, W. Knap, J. Lusakowski, F. Teppe, A. El Fatimy, M. Dyakonov
Joint 31st International Conference on Infrared and Millimeter Waves and 14th International Conference on Terahertz Electronics, IRMMW-THz2006, 2006, China. pp.136, ⟨10.1109/ICIMW.2006.368344⟩. ⟨hal-00241319⟩
Mechanical properties determined by nanoindentation tests of Pb(Zr,Ti)03 and Pb(Mg,Nb)Ti03 sputtered thin films
Patrick Delobelle, E. Fribourg-Blanc, Denis Remiens
Thin Solid Films, 2006, 515, pp. 1385-1393. ⟨hal-00159437⟩