Publications
Affichage de 12611 à 12620 sur 16278
1/f tunnel current noise through Si-bound alkyl monolayers
Nicolas Clément, Stéphane Pleutin, Oliver Seitz, S. Lenfant, D. Cahen, Dominique Vuillaume
Third Meeting on Molecular Electronics, ElecMol'06, Dec 2006, Grenoble, France. ⟨hal-00163254⟩
Victim and aggressor line electrical modelisation in an multicoupled interconnect environment for transient simulation
Freddy Ponchel, Jean-François Legier, Erick Paleczny, Christophe Seguinot, Denis Deschacht
2006, pp.249-251. ⟨hal-00162815⟩
Thermodynamic study of silicon nanowire growth mechanisms
D. Hourlier, P. Perrot
Matériaux 2006, 2006, Dijon, France. ⟨hal-00243978⟩
Systematic lossy error protection of video based on reduced spatial resolution
M. Ramon, François-Xavier Coudoux, Marc G. Gazalet, M Gharbi, Patrick Corlay
13th International Conference on Electronics, Circuits and Systems, ICECS 2006, 2006, France. pp.850-853, ⟨10.1109/ICECS.2006.379922⟩. ⟨hal-00247416⟩
Détection des marnières de Haute Normandie par sismique haute résolution
Bogdan Piwakowski, Lynda Driad-Lebeau, Arkadiusz Kosecki, Pawel Safinowski
Journées AGAP Qualité - GEOFCAN "Géophysique appliquée à la reconnaissance des cavités et des structures anthropiques", Nov 2006, Besançon, France. pp.28-31. ⟨ineris-00973240⟩
Digital tuning of Gm–C baseband filters in configurable radio receivers
D. Chamla, A. Cathelin, S. Dedieu, A. Kaiser
2006, pp.340-343. ⟨hal-00138679⟩
Ultrasonic evaluation of residual stresses in flat glass tempering : comparing experimental investigation and numerical modelling
Marc Duquennoy, D. Devos, Mohammadi Ouaftouh, Dominique Lochegnies, E. Romero
Journal of the Acoustical Society of America, 2006, 119, pp.3773-3781. ⟨hal-00138720⟩
Structural, micro structural and electrical properties comparison of PZT films deposited on different bottom electrodes
Caroline Soyer, Gang Wang, Eric Cattan, Denis Remiens
Integrated Ferroelectrics, 2006, 80, pp.237-243. ⟨hal-00138745⟩
Atomistic simulation of solid phase epitaxy of amorphous silicon : influence of the interatomic potential on the recristallisation velocity
Christophe Krzeminski, V. Cuny, E. Lecat, E. Lampin, A. Pakfar, C. Tavernier, H. Jaouen
Materials Research Society Spring Meeting, MRS Spring 2006, Sub-Second Rapid Thermal Processing for Device Fabrication, 2006, Moscone West, San-Franscico, CA, United States. ⟨hal-00138695⟩
Diffusion and activation of dopants in silicon and advanced silicon-based materials
P. Pichler, C.J. Ortiz, B. Colombeau, N.E.B. Cowern, E. Lampin, S. Uppal, M.S.A. Karunaratne, J.M. Bonar, A. Willoughby, Alain Claverie, Fuccio Cristiano, W. Lerch, S. Paul
Physica Scripta, 2006, T126, pp.89-96. ⟨hal-00138673⟩