Publications

Affichage de 12611 à 12620 sur 16059


  • ART

Parametrically phase conjugate waves : applications in nonlinear acoustic imaging and diagnostics

Vladimir Preobrazhensky

Physics Uspekhi, 2006, 49, pp.98-102. ⟨hal-00138615⟩

  • COMM

Nanostructured self-assembled monolayers of long-chain alkyltrichlorosilanes on Si

S. Desbief, L. Patrone, D. Goguenheim, D. Vuillaume

International Conference on Nano-structures Self-assembling, 2006, Aix-en-Provence, France. ⟨hal-00127135⟩

  • COUV

Sensitivity comparison of multicarrier and spread spectrum systems to phase noise

C. Garnier, M. Loosvelt, Y. Delignon

Fazel K., Kaiser S. Multi-Carrier Spread-Spectrum, Proceedings from the 5th International Workshop, Oberpfaffenhofen, Germany, september 14-16, 2005, Springer, pp.491-502, 2006. ⟨hal-00577012⟩

  • COUV

Electrical, morphological and electromechanical properties of conductive-polymer fibres (yarns)

B. Kim, V. Koncar, C. Dufour

Mattila H.R. Intelligent Textiles and Clothing, Woodhead Publishing Ltd, Cambridge, UK, pp.308-323, 2006. ⟨hal-00577013⟩

  • ART

Preparation and characterizations of Pb(Zr0.53Ti0.47)O3 thick films on LaNiO3 coated Si by modified metallorganic decomposition process

G.S. Wang, Denis Remiens, Caroline Soyer, El Hadj Dogheche, Eric Cattan

Integrated Ferroelectrics, 2006, 80, pp.11-20. ⟨hal-00138744⟩

  • ART

Resonant solutions in wave phase conjugation induced by a limited magneto-acoustic conjugator

A. Merlen, Q. Zhang

Journal of the Acoustical Society of America, 2006, 119, pp.3637-3648. ⟨hal-00138594⟩

  • ART

Inhomogeneous spin reorientation transition (SRT) in giant magnetostrictive TbCo2/FeCo multilayers

A. Klimov, Nicolas Tiercelin, Vladimir Preobrazhensky, Philippe Pernod

IEEE Transactions on Magnetics, 2006, 42, pp.3090-3092. ⟨hal-00138596⟩

  • COMM

Large optimisation of source/drain architecture in double gate CMOS using combined static and transient analysis

Christophe Krzeminski, Emmanuel Dubois

Materials Research Society Spring Meeting, MRS Spring 2006, Transistor Scaling - Methods, Materials, and Modeling, 2006, Moscone West, San-Franscico, CA, United States. ⟨hal-00138694⟩