Publications
Affichage de 13351 à 13360 sur 16551
Estimation des contraintes résiduelles dans le verre par méthode ultrasonore
D. Devos
2006. ⟨hal-00138938⟩
Molecular scale electronics : status and perspectives
D. Vuillaume
Ecole Nanosciences, 2006, Porquerolles, France. ⟨hal-00138922⟩
Iridium silicide : a promising electrode for metallic source/drain in decananometer MOSFETs
G. Larrieu, Emmanuel Dubois, X. Wallart, J. Katcki
2006, pp.123. ⟨hal-00138682⟩
Impact features on Stardust : implications for Comet 81P/Wild 2 dust
F. Hörz, Renaud Bastien, J. Borg, J.P. Bradley, J.C. Bridges, D.E. Brownlee, M.J. Burchell, M. Chi, M.J. Cintala, Z.R. Dai, Z. Djouadi, G. Dominguez, Et Al., David Troadec
Science, 2006, 314, pp.1716-1719. ⟨hal-00138909⟩
Contribution à la caractérisation des revêtements par inversion des réponses V(z)
L. Vandevoorde
2006. ⟨hal-00138940⟩
Room temperature single-electron operation and fabrication of downscaled self-aligned single-dot memory devices
Xing Tang, N. Reckinger, V. Bayot, Christophe Krzeminski, Emmanuel Dubois, A. Villaret, D. Bensahel
Materials Research Society Spring Meeting, MRS Spring 2006, 2006, San Francisco, CA, United States. ⟨hal-00244026⟩
Averaging and oversampling correlator receiver with input quantization
Jean-Michel Rouvaen, B. El Khaldi, Atika Rivenq, Yassin El Hillali
Digital Signal Processing, 2006, 16, pp.120-136. ⟨hal-00128166⟩
Behavior of a traveling-wave amplifier versus temperature in SOI technology
M. Si Moussa, C. Pavageau, P. Simon, Francois Danneville, J. Russat, N. Fel, J.P. Raskin, D. Vanhoenacker-Janvier
IEEE Transactions on Microwave Theory and Techniques, 2006, 54, pp.2675-2683. ⟨hal-00126520⟩
Compact-modeling solutions for nanoscale double-gate and gate-all-around MOSFETs
B. Iniguez, T.A. Fjeldly, A. Lazaro, Francois Danneville, M.J. Deen
IEEE Transactions on Electron Devices, 2006, 53, pp.2128-2142. ⟨hal-00126518⟩