Publications
Affichage de 13381 à 13390 sur 16055
Group-IV Semiconductor Nanostructures - Materials Research Society 2004 Fall Symposium Proceedings, volume 832
L. Tsybeskov, D.J. Lockwood, C. Delerue, M. Ichikawa
Materials Research Society, Warrendale, PA, USA, pp.F1.1 - F11.8, 2005. ⟨hal-00131730⟩
Inelastic tunneling spectra of an alkyl self-assembled monolayer using a MOS tunnel junction as a test-bed
C. Petit, G. Salace, S. Lenfant, D. Vuillaume
14th Biennial Conference on Insulating Films on Semiconductors, 2005, Belgium. pp.398-401, ⟨10.1016/j.mee.2005.04.011⟩. ⟨hal-00247649⟩
High Accuracy 65nm OPC Verification: Full Process Window Model vs. Critical Failure ORC
Amandine Borjon, Jerome Belledent, Shumay D. Shang, Olivier Toublan, Corinne Miramond, Kyle Patterson, Kevin Lucas, Christophe Couderc, Yves Rody, Frank Sundermann, Jean-Christophe Urbani, Stanislas Baron, Yorick Trouiller, Patrick Schiavone
2005, pp.1750-1761. ⟨hal-00023223⟩
Conception d'amplificateurs distribués en bande K avec une technologie CMOS SOI partiellement désertée 130 nm
C. Pavageau, M. Si Moussa, A. Siligaris, L. Picheta, Francois Danneville, J.P. Raskin, D. Vanhoenacker-Janvier, J. Russat, N. Fel
Actes des 14èmes Journées Nationales Microondes, 2005, Nantes, France. ⟨hal-00247447⟩
Fuzzy logic modelling of electrical properties – PANI/Dyneema® conductive fibres
B. Kim, V. Koncar, C. Dufour
5th World Textile Conference, AUTEX 2005, 2005, Portorož, Slovenia. ⟨hal-00247654⟩
Etude phénoménologique du couplage d'un connecteur blindé installé sur circuit imprimé
Youssef Bouri
GDR ONDES - Assemblée Générale : Interférences d'Ondes, Nov 2005, Besançon, France. pp.151-152. ⟨hal-00247721⟩
Spectroscopie diélectrique THz de biomolécules en solution
Vianney Mille, Nour Eddine Bourzgui, Bertrand Bocquet
Actes des 1ères Journées du GDR Térahertz, 2005, Montpellier, France. ⟨hal-00247709⟩
Compensation by design of thermal dilatation in RF MEMS switches
Q.H. Duong, X. Lafontan, D. Collard, L. Buchaillot, P. Schmitt, Patrick Pons, F. Flourens, F. Pressecq
2005, pp.190-194. ⟨hal-00128657⟩
Thermal and electrostatic reliability characterization in RF MEMS switches
Q.H. Duong, L. Buchaillot, D. Collard, P. Schmitt, X. Lafontan, Patrick Pons, F. Flourens, F. Pressecq
Microelectronics Reliability, 2005, 45, pp.1790-1793. ⟨hal-00154911⟩
Behavior of a common source traveling wave amplifier versus temperature in SOI technology
M. Si Moussa, C. Pavageau, P. Simon, Francois Danneville, J. Russat, N. Fel, J.P. Raskin, D. Vanoenacker-Janvier
EuMA - Journal of the European Microwave Association, 2005, 1, pp.288-292. ⟨hal-00125165⟩