Publications

Affichage de 13641 à 13650 sur 16090


  • Article dans une revue

Aluminum, oxide and silicon phonons by IETS on MOS tunnel junctions : accurate determination and effect of electrical stress

C. Petit, G. Salace, D. Vuillaume

Journal of Applied Physics, 2004, 96, pp.5042-5049. ⟨hal-00140733⟩

  • Article dans une revue

Conductivity of DNA probed by conducting-atomic force microscopy : effects of contact electrode, DNA stucture and surface interactions

T. Heim, D. Deresmes, Dominique Vuillaume

Journal of Applied Physics, 2004, 96, pp.2927-2936. ⟨10.1063/1.1769606⟩. ⟨hal-00140730⟩

  • Communication dans un congrès

Silicon-molecules-metal junctions by nanotransfer printing, chemical synthesis and electrical properties

C. Merckling, David Guérin, S. Lenfant, D. Vuillaume

Ultimate Lithography and Nanodevice Engineering, 2004, Agelonde, France. ⟨hal-00140753⟩

  • Communication dans un congrès

Principles of MMMS actuation by locally deposed magnetostrictive thin films with induced spin reorientation transition

Vladimir Preobrazhensky, Philippe Pernod, H. Le Gall, S. Masson, O. Ducloux, S. Euphrasie

2004, pp.374-377. ⟨hal-00140731⟩

  • Communication dans un congrès

Microfluidic devices to measure the electrical impedance of single bio-cells

V. Senez, T. Yamamoto, B. Poussard, T. Fukuba, J.M. Capron, T. Fujii

2004, pp.53-56. ⟨hal-00141029⟩

  • Autre publication scientifique

Etude et réalisation de photodiodes-guides millimétriques de puissance à 1,5 microns

N. Michel

2004. ⟨hal-00141172⟩

  • Article dans une revue

Optimization of HSQ resist e-beam processing technique on GaAs material

D. Lauvernier, Jean-Pierre Vilcot, M. Francois, Didier Decoster

Microelectronic Engineering, 2004, 75, pp.177-182. ⟨hal-00141186⟩

  • Article dans une revue

Probing nanoscale dipole-dipole interactions by electric force microscopy

Thierry Melin, H. Diesinger, D. Deresmes, D. Stievenard

Physical Review Letters, 2004, 92, pp.166101-1-4. ⟨hal-00141249⟩