Publications
Affichage de 13641 à 13650 sur 16090
Aluminum, oxide and silicon phonons by IETS on MOS tunnel junctions : accurate determination and effect of electrical stress
C. Petit, G. Salace, D. Vuillaume
Journal of Applied Physics, 2004, 96, pp.5042-5049. ⟨hal-00140733⟩
Conductivity of DNA probed by conducting-atomic force microscopy : effects of contact electrode, DNA stucture and surface interactions
T. Heim, D. Deresmes, Dominique Vuillaume
Journal of Applied Physics, 2004, 96, pp.2927-2936. ⟨10.1063/1.1769606⟩. ⟨hal-00140730⟩
Lithium insertion mechanism in CoSb3 analysed by 121Sb Mössbauer spectrometry, X-ray: Absorption Spectroscopy and electronic structure calculations
Isabelle Devos, Manfred Womes, Mike Heilemann, Josette Olivier-Fourcade, Jean-Claude Jumas, José Luis Tirado
Journal of Materials Chemistry, 2004, 14, pp.1759-1767. ⟨10.1039/B312618H⟩. ⟨hal-00141245⟩
Silicon-molecules-metal junctions by nanotransfer printing, chemical synthesis and electrical properties
C. Merckling, David Guérin, S. Lenfant, D. Vuillaume
Ultimate Lithography and Nanodevice Engineering, 2004, Agelonde, France. ⟨hal-00140753⟩
Principles of MMMS actuation by locally deposed magnetostrictive thin films with induced spin reorientation transition
Vladimir Preobrazhensky, Philippe Pernod, H. Le Gall, S. Masson, O. Ducloux, S. Euphrasie
2004, pp.374-377. ⟨hal-00140731⟩
Simulation, conception et réalisation d'un commutateur en technologie microsystème pour dispositifs logiques sécuritaires
F. Conseil
2004. ⟨hal-00141010⟩
Microfluidic devices to measure the electrical impedance of single bio-cells
V. Senez, T. Yamamoto, B. Poussard, T. Fukuba, J.M. Capron, T. Fujii
2004, pp.53-56. ⟨hal-00141029⟩
Etude et réalisation de photodiodes-guides millimétriques de puissance à 1,5 microns
N. Michel
2004. ⟨hal-00141172⟩
Optimization of HSQ resist e-beam processing technique on GaAs material
D. Lauvernier, Jean-Pierre Vilcot, M. Francois, Didier Decoster
Microelectronic Engineering, 2004, 75, pp.177-182. ⟨hal-00141186⟩
Probing nanoscale dipole-dipole interactions by electric force microscopy
Thierry Melin, H. Diesinger, D. Deresmes, D. Stievenard
Physical Review Letters, 2004, 92, pp.166101-1-4. ⟨hal-00141249⟩