Publications
Affichage de 14121 à 14130 sur 16273
Characterization of As-P interface-sensitive GaInP/GaAs structures grown in a production MBE system
S. Dhellemmes, S. Godey, A. Wilk, X. Wallart, F. Mollot
2004, pp.159-162. ⟨hal-00140719⟩
Atomic-scale observation of dopant atoms in GaAs
G. Mahieu, D. Deresmes, B. Grandidier, J.P. Nys, D. Stievenard
PICO : The Omicron NanoTechnology Newsletter, 2004, 8, pp.6-7. ⟨hal-00142060⟩
Simulation of dual array multipath channels using mode stirred reverberation chamber
M. Lienard, Pierre Degauque
Electronics Letters, 2004, 40, pp.578-580. ⟨hal-00142000⟩
The evaluation of surface residual stress in aeronautic bearings using the Barkhausen noise effect
S. Desvaux, Marc Duquennoy, J. Gualandri, Mohamed Ourak
NDT & E International, 2004, 37, pp.9-17. ⟨hal-00142004⟩
InAlAs-InGaAs double-gate HEMTs on transferred substrate
Nicolas Wichmann, I. Duszynski, X. Wallart, S. Bollaert, A. Cappy
IEEE Electron Device Letters, 2004, 25, pp.354-356. ⟨hal-00133868⟩
Angle of arrival measurement using ultra fast transient analyzer and music algorithm
A. Benlarbi-Delai, N. Rolland-Haese, A. Ghis, P.A. Rolland
Microwave and Optical Technology Letters, 2004, 41, pp.141-144. ⟨hal-00133924⟩
Non-linear modeling of the kink effect in deep sub-micron SOI MOSFET
A. Siligaris, Gilles Dambrine, Francois Danneville
2004, pp.47-50. ⟨hal-00133900⟩
Sur la signification des valeurs du module d'Young déterminé par nanoindentation dans le cas des matériaux ferroélectriques
Patrick Delobelle, Olivier Guillon, E. Fribourg-Blanc, Caroline Soyer, Denis Remiens
2004. ⟨hal-00020033⟩
Noise in devices and circuits II – Proceedings of SPIE Vol. 5470
Francois Danneville, F. Bonani, J. Deen, M. Levinshtein
SPIE – The International Society for Optical Engineering, Bellingham, WA, USA, 585 p., 2004. ⟨hal-00131720⟩