Publications

Affichage de 14181 à 14190 sur 16109


  • Article dans une revue

M-line spectroscopy for optical analysis of thick LiNbO3 layers grown on sapphire substrates by radio-frequency multistep sputtering

El Hadj Dogheche, X. Lansiaux, Denis Remiens

Journal of Applied Physics, 2003, 93 (2), pp.1165-1168. ⟨10.1063/1.1530367⟩. ⟨hal-00146473⟩

  • Article dans une revue

Mechanical analysis of interconnect structures using process simulation

V. Senez, T. Hoffmann, P. Le Duc, F. Murray

Journal of Applied Physics, 2003, 93, pp.6039-6049. ⟨hal-00146398⟩

  • Chapitre d'ouvrage

Metamorphic InAIAs/InGaAs HEMTs : material properties and device performance

Y. Cordier, S. Bollaert, M. Zaknoune, J.M. Chauveau, A. Cappy

CAI W.Z. III-V semiconductor heterostructures : physics and devices, Research Signpost, Kerala, India, pp.111-138, 2003. ⟨hal-00132383⟩

  • Communication dans un congrès

Numerical analysis of the process induced stresses in silicon microstructures

V. Senez, T. Hoffmann, A. Armigliato, I. de Wolf

2003, pp.350-361. ⟨hal-00146444⟩

  • Article dans une revue

Low frequency drain noise comparison of AlGaN/GaN HEMTs grown on silicon, SiC and sapphire substrates

A. Curutchet, N. Malbert, N. Touboul, Christophe Gaquière, A. Minko, M. Uren

Microelectronics Reliability, 2003, 43, pp.1713-1718. ⟨hal-00146665⟩

  • Communication dans un congrès

Détermination des paramètres limitant la montée des MOSFETs sub-100nm

M. Vanmackelberg, Sylvie Lepilliet, C. Raynaud, M. Dehan, Gilles Dambrine

2003, pp.1D-5. ⟨hal-00145999⟩

  • Communication dans un congrès

Study and realisation of a micromechanical relay for use in harsh environment

F. Conseil, P. Derderian, M.F. Ravat, D. Collard, L. Buchaillot

2003, pp.108-112. ⟨hal-00146461⟩

  • Article dans une revue

60-GHz high power performance In0.32 Al0.68 As-In0.33 Ga 0.67 As metamorphic HEMTs on GaAs

M. Zaknoune, M. Ardouin, Y. Cordier, S. Bollaert, B. Bonte, Didier Theron

IEEE Electron Device Letters, 2003, 24, pp.724-726. ⟨hal-00146648⟩