Publications
Affichage de 14321 à 14330 sur 16250
Deposition of ferroelectric BST thin films by sol gel route in view of electronic applications
G. Velu, Jean-Claude Carru, Eric Cattan, Denis Remiens, X. Melique, D. Lippens
Ferroelectrics, 2003, 288 (1), pp.59-69. ⟨10.1080/00150190390212007⟩. ⟨hal-00146068⟩
Stress engineering in Si based micro structures using technology computer-aided design
V. Senez, A. Armigliato, G. Carlotti, G. Carnevale, H. Jaouen, I. de Wolf
IEICE Transactions on Electronics, 2003, E86-C, pp.284-294. ⟨hal-00146409⟩
Techniques for mechanical strain analysis in submicron structures : TEM/CBED, micro-Raman spectroscopy, X-RAY micro-diffraction and modelling
I. de Wolf, V. Senez, R. Balboni, A. Armigliato, S. Frabboni, A. Cedola, S. Lagomarsino
Microelectronic Engineering, 2003, 70, pp.425-435. ⟨hal-00146410⟩
Nouvelles structures laser pour émission bimode
S. Garidel, Jean-Pierre Vilcot, Didier Decoster, M. Francois, M. Muller
Actes de TELECOM 03 et 3èmes Journées Franco-Maghrébines des Microondes et leurs Applications, JFMMA 2003, 2003, Marrakech, Maroc. ⟨hal-00146536⟩
Analyse temporelle d'interconnexions VLSI submicroniques en présence de charges non linéaires
Freddy Ponchel, Erick Paleczny, Jean-François Legier, Christophe Seguinot
Actes de TELECOM 03 et 3èmes Journées Franco-Maghrébines des Microondes et leurs Applications, JFMMA 2003, 2003, Marrakech, Maroc. ⟨hal-00146538⟩
Raman characterization of Mg+ ion-implanted GaN
B. Boudart, Yannick Guhel, J. C. Pesant, Paul Dhamelincourt, M.A. Poisson
7th International Workshop on Beam Injection Assessment of Microstructures in Semiconductors, 2003, Lille, France. ⟨hal-01649531⟩
Giant oscillations in the picosecond ultrasonics response of crystalline silicon : connection with electronic structure
Arnaud Devos, R. Cote, A. Le Louarn
2003, pp.1197-1200. ⟨hal-00144890⟩
Giant magnetostriction nanostructures for actuation of microsystems
Philippe Pernod, Vladimir Preobrazhensky
2003, pp.7. ⟨hal-00146135⟩
Self-assembled monolayers and molecular-scale electronics
D. Vuillaume
Nano et micro technologies, 2003, 3, pp.35-57. ⟨hal-00146157⟩
Injection contrôlée de charges dans des nanoparticules individuelles de silicium
H. Diesinger, Thierry Melin, D. Deresmes, D. Stievenard
Forum des microscopies à sonde locale, 2003, Montpellier, France. ⟨hal-00146612⟩