Publications
Affichage de 14341 à 14350 sur 16090
Caractérisation opto-micro-ondes de commutateurs optiques, application aux mesures d'indices de réfraction
Samuel Dupont, K. Blary, Jean-Pierre Vilcot, J. Chazelas, H. Li, Didier Decoster
2003, pp.5C-7. ⟨hal-00146560⟩
Gallium nitride activity at TIGER
S. Delage, C. Brylinski, Jean-Claude de Jaeger
CEPA2 Microelectronics Workshop, 2003, Gothenburg, Sweden. ⟨hal-00146713⟩
Optimisation de la qualité vidéo MPEG-2 en transmission ADSL. Etude d'un transcodage vidéo hiérarchique
J. Fauquet
2003. ⟨hal-00146714⟩
Contribution à la caractérisation diélectrique microonde de cristaux liquides. Applications aux circuits agiles en fréquence
N. Tentillier
2003. ⟨hal-00162747⟩
Electro-optical probe dedicated to the on-line testing of electronic systems
B. Pannetier, P. Lemaitre-Auger, S. Tedjini, El Hadj Dogheche, Denis Remiens
2003, pp.275. ⟨hal-00162741⟩
Crystallographic and optical properties of epitaxial Pb(Zr-0.6,Ti-0.4)O-3 thin films grown on LaAlO3 substrates
B. Vilquin, R. Bouregba, G. Poullain, H. Murray, El Hadj Dogheche, Denis Remiens
Journal of Applied Physics, 2003, 94 (8), pp.5167-5171. ⟨10.1063/1.1610776⟩. ⟨hal-00162729⟩
High frequency noise sources extraction in nanometrique MOSFETs
Francois Danneville, G. Pailloncy, Gilles Dambrine
NATO Advanced Research Workshop, Advanced Experimental Methods for Noise Research in Nanoscale Electronic Devices, 2003, Brno, Czech Republic. ⟨hal-00146038⟩
Nondestructive defects detection inside dielectric materials by microwave techniques
M. Maazi, D. Glay, T. Lasri
2003, pp.Session 3A. ⟨hal-00146044⟩
Inelastic electron tunneling spectroscopy in n-MOS junctions with ultra-thin oxides
C. Petit, G. Salace, D. Vuillaume
Solid-State Electronics, 2003, 47, pp.1663-1668. ⟨hal-00146155⟩
Self-assembled materials
D. Vuillaume
International Summer School on Advanced Microelectronics, MIGAS 2003, 2003, Autrans, France. ⟨hal-00146172⟩