Publications
Affichage de 14381 à 14390 sur 16273
Property comparison of 2 mm thick cymbal and double dipper transducers
S.E. Danley, R.E. Newnham, D.C. Markley, R.J. Meyer, Anne-Christine Hladky
2003 US Navy Workshop on Acoustic Transduction Materials and Devices, 2003, State College, PA, United States. ⟨hal-00145967⟩
Validation d'un modèle non linéaire pour MOSFET au moyen des mesures grand signal
A. Siligaris, Gilles Dambrine, D. Schreurs, Francois Danneville
2003, pp.6A-4. ⟨hal-00146013⟩
Nonlinear electron transport in InGaAs/InAlaS ballistic devices
Benoit Hackens, L. Gence, Sébastien Faniel, Cédric Gustin, Hervé Boutry, Lukasz Bednarz, Isabelle Huynen, Vincent Bayot, X. Wallart, A. Cappy, Javier Mateos, Tomás González
Trends in NanoTechnology, TNT 2003, Sep 2003, Salamanca, Spain. ⟨hal-00146041⟩
Ballistic nanodevices for terahertz data processing : Monte Carlo simulations
J. Mateos, B.G. Vasallo, D. Pardo, T. Gonzales, Yannick Roelens, S. Bollaert, A. Cappy
Nanotechnology, 2003, 14, pp.117-122. ⟨hal-00145979⟩
Double-gate HEMTs on transferred substrate
Nicolas Wichmann, I. Duszynski, T. Parenty, S. Bollaert, J. Mateos, X. Wallart, A. Cappy
2003, pp.118-121. ⟨hal-00145995⟩
Fabrication of nano-ballistic devices using high resolution process
Emmanuelle Pichonat, Jean-Sebastien Galloo, Yannick Roelens, S. Bollaert, X. Wallart, A. Cappy, Javier Mateos, Tomás González, Hervé Boutry, Vincent Bayot, Lukasz Bednarz
Trends in NanoTechnology, TNT 2003, Sep 2003, Salamanca, Spain. ⟨hal-00146012⟩
Non-linear phenomenological model for RF advanced MOSFET
A. Siligaris, Gilles Dambrine, Sylvie Lepilliet, D. Schreurs, Francois Danneville
European IC-CAP User Meeting, 2003, Prague, Czech Republic. ⟨hal-00146016⟩
Acoustique picoseconde et structure électronique
Arnaud Devos
2èmes Journées Ultrasons-Laser, 2003, Paris, France. ⟨hal-00145962⟩
IEMN : a center of the french network for basic research in Micro@Nano technology
A. Cappy
Trends in NanoTechnology, TNT 2003, 2003, Salamanca, Spain. ⟨hal-00146046⟩
Quantum calculation of leakage current in stacked gate dielectrics for nano-MOS structures
Eric Lheurette, M. Le Roy, O. Vanbésien, D. Lippens
Proceedings of the 14th Workshop on Modelling and Simulation of Electron Devices, 2003, Barcelona, Spain. ⟨hal-00146102⟩