Publications
Affichage de 14481 à 14490 sur 16255
Comparative measurements of the optical spectrum dependence on distance between laterally coupled diode lasers
H. Lamela, R. Santos, G. Carpintero, Jean-Pierre Vilcot, A. Barsella, J. Figueiredo, M. Pessa
2003, pp.86-91. ⟨hal-00146495⟩
Self-assembled molecular rectifying diodes on silicon : synthesis, experimental and theoretical charge transport studies
Dominique Vuillaume, Stéphane Lenfant, Christophe Krzeminski, Guy Allan, Christophe Delerue
226th American Chemical Society National Meeting - Fall 2003, Sep 2003, New York, NY, United States. ⟨hal-00146383⟩
Design, realization and testing of micro-mechanical resonators in thick-film silicon technology with postprocess electrode to resonator gap reduction
D. Galayko, A. Kaiser, L. Buchaillot, Bernard Legrand, D. Collard, C. Combi
Journal of Micromechanics and Microengineering, 2003, 13, pp.134-140. ⟨hal-00146391⟩
Relation between thermal evolution of interstitial defects and transient enhanced diffusion in silicon
Alain Claverie, Fuccio Cristiano, B. Colombeau, Xavier Hebras, P. Calvo, Nikolay Cherkashin, Y. Lamrani, E. Scheid, B. de Mauduit
2003, pp.73. ⟨hal-00146421⟩
Actionneurs films minces pour contrôle santé de structures
E. Fribourg-Blanc, M. Dupont, D. Osmont, Eric Cattan, Denis Remiens
Instrumentation, Mesure, Métrologie, 2003, 3, pp.225-237. ⟨hal-00146476⟩
Electrostatical coupling-spring for micro-mechanical filtering applications
D. Galayko, A. Kaiser, L. Buchaillot, D. Collard, C. Combi
2003, pp.530-533. ⟨hal-00146403⟩
Microfluidic systems for high-throughput proteomics
S. Le Gac, S. Arscott, C. Druon, P. Tabourier, C. Rolando
2003, pp.70-73. ⟨hal-00146443⟩
Nouveaux guides optiques sub-micrométriques à base de matériaux III-V et polymère pour circuits photoniques et microondes ultracompacts
D. Lauvernier, Joseph Harari, Jean-Pierre Vilcot, Didier Decoster
Actes des 22èmes Journées Nationales d'Optique Guidée, JNOG 2003, 2003, Valence, France. ⟨hal-00146540⟩
Behavioural model for AlGaN/GaN HEMT's on sapphire and SiC constructed from multi-bias signal measurements
D. Schreus, N. Vellas, Christophe Gaquière, Marie Germain, G. Borghs
27th Workshop on Compound Semiconductor Devices and Integrated Circuits held in Europe, WOCSDICE 2003, 2003, Fürigen, Switzerland. ⟨hal-00146689⟩
Techniques for mechanical strain analysis in submicron structures : TEM/CBED, micro-Raman spectroscopy, X-RAY micro-diffraction and modelling
I. de Wolf, V. Senez, S. Lagomarsino, A. Armigliato
Proceedings of the 2003 European Workshop on Materials for Advanced Metallization, MAM 2003, 2003, La Londe les Maures, France. ⟨hal-00146413⟩