Publications
Affichage de 14941 à 14950 sur 16279
Solid-state 8 GHz transient signal digitizer characterization
A. Ghis, P. Ouvrier-Buffet, N. Rolland, A. Benlarbi-Delai, P.A. Rolland, D. Glay, D. Jaeger
2002, pp.1673-1676. ⟨hal-00148329⟩
Multiple parallel conduction paths observed in depth-profiled n-GaN epilayers
C. Mavroidis, J. Harris, R. Jackman, I. Harrison, B. Ansell, Z. Bougrioua, I. Moerman
Journal of Applied Physics, 2002, 91 (12), pp.9835. ⟨10.1063/1.1477604⟩. ⟨hal-02906594⟩
Fabrication of a pMUT using silicon bulk micromachining and a sputtered PZT layer
W. Daniau, Karim Dogheche, S. Ballandras, Eric Cattan, Denis Remiens, W. Steichen, P. Blind
Proc. of the 2nd WorkShop on MUT, Besançon, 2002, pp. june. ⟨hal-00123195⟩
Microwave technique for detection, location and sizing of buried objects
Latifa Achrait-Furlan, T. Lasri, Ahmed Mamouni
Microwave and Optical Technology Letters, 2002, 32 (2), pp.145-149. ⟨10.1002/mop.10115⟩. ⟨hal-00147852⟩
Photodissociation of hydrogen passivated dopants in gallium arsenide
L. Tong, J.A. Larsson, M. Nolan, M. Murthag, J.C. Greer, M. Barbe, F. Bailly, Jérome Chevalier, S. Sylvestre, D. Loridant-Bernard, E. Constant, M. Constant
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 2002, 186, pp.234-239. ⟨10.1016/S0168-583X(01)00949-1⟩. ⟨hal-00278930⟩
Piezoelectric properties of sputtered PZT films: influence of structure, microstructure, film thickness, (Zr,Ti) ratio and Nb substitution
Denis Remiens, Eric Cattan, Caroline Soyer, T. Haccart
European Materials Research Society Spring Meeting, Symposium P, Advanced Materials for Microelectronics : Ferroelectrics and Low-k Dielectrics, 2002, France. pp.123-127. ⟨hal-00250393⟩
Interactions entre les ultrasons et les matrices fromagères
Georges Nassar, Bertrand Nongaillard, C. Achilleos, L. Tessier, Y. Noel
7ème Colloque PROSETIA, Procédés de Séparation et de Transformation dans les Industries Agroalimentaires, 2002, Compiègne, France. ⟨hal-00149925⟩
High-frequency high-Q micro-mechanical resonators in thick epipoly technology with post-process gap adjustment
D. Galayko, A. Kaiser, Bernard Legrand, C. Combi, D. Collard, L. Buchaillot
2002, pp.665-668. ⟨hal-00148737⟩
Reliability of polysilicon microstructures : in situ test benches
O. Millet, D. Collard, L. Buchaillot
Microelectronics Reliability, 2002, 42, pp.1795-1800. ⟨hal-00148766⟩
Electronic characteristics of silicon-organic interfaces
S. Kar, D. Vuillaume
Materials Research Society Fall Meeting, 2002, Boston, MA, United States. ⟨hal-00148710⟩