Publications
Affichage de 15171 à 15180 sur 16181
Development of a new ultrasonic technique for bone and biomaterials characterization
Fabrice Lefebvre, Jean-Jacques Fabre, D.D. Ahite, Pierre Campistron
11th Interdisciplianary Research Conference on Biomaterials, 2001, Coquelles, France. ⟨hal-00152949⟩
Thermally assisted formation of silicon islands on a silicon on insulator substrate
Bernard Legrand, Vincent Agache, Thierry Melin, Jean-Philippe Nys, Vincent Senez, Didier Stiévenard
Journal of Applied Physics, 2001, 91, pp.106-111. ⟨10.1063/1.1420761⟩. ⟨hal-00152464⟩
Etude de la transmission de données par modulation DMT sur le réseau électrique
David Buèche, Patrick Corlay, Marie Zwingelstein, Marc G. Gazalet, François-Xavier Coudoux, Francis Haine
Actes du 18ème Colloque GRETSI sur le Traitement du Signal et des Images, GRETSI 2001, Sep 2001, Toulouse, France. ⟨hal-00152920⟩
Monitoring of milk gelation using a low-frequency ultrasonic technique
Georges Nassar, Bertrand Nongaillard, Y. Noël
Journal of Food Engineering, 2001, 48, pp.351-359. ⟨hal-00152936⟩
Statistical estimation of fast channels for cellular mobile telecommunications systems
Iyad Dayoub, Atika Rivenq, M. Zaizouni, Jean-Michel Rouvaen
2001, pp.15-19. ⟨hal-00152929⟩
Contribution au contrôle actif de santé de structures composites aéronautiques par transducteurs piézoélectroélectriques insérés
Christophe Paget
2001. ⟨hal-00152933⟩
Design optimization of low-noise HEMTs
J. Mateos, T. Gonzales, D. Pardo, Virginie Hoel, S. Bollaert, A. Cappy
2001, pp.1777-1778. ⟨hal-00151768⟩
Advanced source/drain architecture using very low Schottky barriers : device design and material engineering
Emmanuel Dubois, G. Larrieu
2001, pp.203-206. ⟨hal-00152202⟩
Design optimisation of ultra-short gate HEMTs using Monte Carlo simulation
J. Mateos, T. Gonzales, D. Pardo, Virginie Hoel, S. Bollaert, A. Cappy
3a Conferencia de Dispositivos Electronicos, 2001, Granada, Spain. ⟨hal-00151778⟩
Monte Carlo simulation of electronics characteristics in short channel delta-doped AllnAs/GaInAs HEMTs
J. Mateos-Lopez, T. Gonzalez, D. Pardo, Virginie Hoel, H. Happy, A. Cappy
Microelectronics Reliability, 2001, 41, pp.73-77. ⟨hal-00151760⟩