Publications
Affichage de 15461 à 15470 sur 16273
Numerical modelling of shape memory alloy nonlinear behavior laws : application to an adaptative structure
L. Buchaillot, S. Rafanomezantsoa, Anne-Christine Hladky, I. Roch
Proceedings of the 2000 International Conference on Shape Memory and Superelastic Technologies, SMST-2000, 2000, Pacific Grove, CA, United States. ⟨hal-00158519⟩
Synthesis and microwave characterizations of crosslinked oligoimide
L. Bes, B. Boutevin, A. Rousseau, R. Mercier, B. Bellini, Didier Decoster, J.F. Larchanche, Jean-Pierre Vilcot
Synthetic Metals, 2000, 115, pp.251-256. ⟨hal-00158576⟩
Les matériaux métamorphiques : une voie pour l'intégration de composants pour applications millimétriques sur substrat d'arséniure de gallium
Y. Cordier, A. Cappy, M. Zaknoune, S. Bollaert
Journée Thématique sur l'Electronique Intégrée, 2000, Arcueil, France. ⟨hal-00158447⟩
Low-voltage, 30 nm channel length, organic transistors with a self-assembled monolayer as gate insulating films
J. Collet, O. Tharaud, A. Chapoton, D. Vuillaume
Applied Physics Letters, 2000, 76, pp.1941-1943. ⟨hal-00158477⟩
New regulated voltage down converter based on modified bandgap cell
Edith Kussener, Herve Barthelemy, A. Robers, A. Malherbe, A. Kaiser
2000, pp.19-21. ⟨hal-00158509⟩
An analog beam-forming circuit for ultrasound imaging using switched-current delay lines
Bruno Stefanelli, I. O'Connor, L. Quiquerez, Andreas Kaiser, D. Billet
IEEE Journal of Solid-State Circuits, 2000, 35, pp.202-211. ⟨hal-00158512⟩
Quantum confinement energies in zinc-blende III-V and diamond IV semiconductors
Guy Allan, Yann-Michel Niquet, Christophe Delerue
Applied Physics Letters, 2000, 77, pp.639-641. ⟨10.1063/1.127070⟩. ⟨hal-00158665⟩
Atomic-scale study of GaMnAs/GaAs
B. Grandidier, J.P. Nys, C. Delerue, D. Stievenard, Y. Higo, M. Tanaka
Applied Physics Letters, 2000, 77, pp.4001-4003. ⟨hal-00158645⟩
Method for tight-binding parametrization : application to silicon nanostructures
Yann-Michel Niquet, Christophe Delerue, Guy Allan, Michel Lannoo
Physical Review B: Condensed Matter and Materials Physics (1998-2015), 2000, 62, pp.5109-5116. ⟨10.1103/PhysRevB.62.5109⟩. ⟨hal-00158664⟩
Microscopic characterization of defects using scanning tunneling microscopy
D. Stievenard
Materials Science and Engineering: B, 2000, B71, pp.120-127. ⟨hal-00158667⟩