Publications
Affichage de 15601 à 15610 sur 16386
Organic self-assembled monolayers on silicon : electronic properties and applications in nanoelectronics and molecular electronics devices
D. Vuillaume
Instituto di ellectronica dello stato solido, 2000, Roma, Italy. ⟨hal-00158486⟩
A MEMS oriented distributed processor for integrated feed-back controller
Y. Mita, A. Kaiser, Patrick Garda, M. Milgram, H. Fujita
Electronics and Communications in Japan, Part 2 : Electronics, 2000, 83, pp.48-55. ⟨hal-00158498⟩
Surface roughness, strain and alloy segregation in lattice matched heteroepitaxy
C. Priester, G. Grenet
Physical Review B: Condensed Matter and Materials Physics (1998-2015), 2000, 61, pp.16029-16032. ⟨hal-00158658⟩
Fabricating conductive microstructures by direct electron beam writing on hydrogenated n-type Si-doped GaAs
S. Silvestre, E. Constant, D. Bernard-Loridant, B. Sieber
Applied Physics Letters, 2000, 19, pp.2731-2733. ⟨hal-00158583⟩
Croissance EJM d'îlots InAs sur des tampons AIInAs et GaInAs désadaptés sur GaAs
Y. Cordier, P. Miska, D. Ferre
13ème Séminaire National sur l'Epitaxie par Jets Moléculaires, EJM 2000, 2000, Saint Aygulf, France. ⟨hal-00158439⟩
A 57 GHz radio over fiber transmission using sub-carrier local oscillator generation
Samuel Dupont, Christophe Loyez, Jean-Pierre Vilcot, P.A. Rolland, Didier Decoster
Semiconductor and Integrated Optoelectronics Conference, SIOE 2000, 2000, Cardiff, United Kingdom. ⟨hal-00158600⟩
MBE growth of InAs dots on InAlAs and InGaAs buffers lattice mismatched on GaAs
Y. Cordier, P. Miska, D. Ferre
Proceedings of the 11th International Conference on Molecular Beam Epitaxy, MBE XI, 2000, Beijing, China. ⟨hal-00158218⟩
Time frequency analysis of impact-echo signals : numerical modelling and experimental validation
O. Abraham, C. Leonard, P. Cote, Bogdan Piwakowski
Materials Journal, 2000, 97, pp.645-657. ⟨hal-00250444⟩
Caractérisation des tumeurs du sein par imagerie radiométrique microonde
Bertrand Bocquet, Y. Leroy, Ahmed Mamouni, N. Rocourt, Patrick Devos, Y. Robert
6èmes Journées Caractérisation Microonde et Matériaux, JCMM 2000, 2000, Paris, France. ⟨hal-00158168⟩