Publications
Affichage de 15611 à 15620 sur 16232
Microsysteme : un état des lieux, enjeux et perspectives
D. Collard, L. Buchaillot, Bernard Legrand
48èmes Journées Nationales de l'Union des Physiciens, 2000, Lille, France. ⟨hal-00158538⟩
On 2D/3D numerical oxidation modeling : calibration and investigation of silicon crystal orientation effect on stresses in shallow trench isolations
T. Hoffmann, K.F. Dombrowski, V. Senez
2000, pp.59-62. ⟨hal-00158513⟩
A silicon shadow mask for deposition on isolated areas
A. Tixier, Y. Mita, J.P. Gouy, H. Fujita
Journal of Micromechanics and Microengineering, 2000, 10, pp.157-162. ⟨hal-00158497⟩
Very low-voltage fully differential amplifier for switched capacitor applications
M. Dessouky, A. Kaiser
2000, pp.441-444. ⟨hal-00158508⟩
Microsystème : enjeux et perspectives
D. Collard, L. Buchaillot, Bernard Legrand
Journée IMAPS : International Microelectronics and Packaging Society, 2000, Lille, France. ⟨hal-00158539⟩
Impact of inductance on timing characteristics of VLSI interconnects
Gregory Servel, Fabrice Huret, Erick Paleczny, P. Kennis, Denis Deschacht
2000, pp.C17/1-6. ⟨hal-00158602⟩
Surface morphology and strain relaxation of InAlAs buffer layers grown lattice mismatched on GaAs with inverse steps
Y. Cordier, D. Ferre, J.M. Chauveau, J. Dipersio
Applied Surface Science, 2000, 166, pp.442-445. ⟨hal-00158436⟩
Growth of strained Ga1-xInxP layers on GaP (001) by gas source molecular beam epitaxy : comparison with the GaInAs/GaAs system
X. Wallart, D. Deresmes, F. Mollot
2000, pp.231-234. ⟨hal-00158442⟩
Strained layer growth of Ga1-xInxP on GaAs (100) and GaP (100) substrates
X. Wallart, F. Mollot
Applied Surface Science, 2000, 166, pp.446-450. ⟨hal-00158444⟩
Determination of the electrical properties of thermally grown ultrathin nitride films
N. Pic, A. Glachant, S. Nitsche, J.Y. Hoarau, D. Goguenheim, D. Vuillaume, A. Sibai, C. Chaneliere
Microelectronics Reliability, 2000, 40, pp.589-592. ⟨hal-00158478⟩