Publications
Affichage de 15631 à 15640 sur 16105
Les alliages à mémoire de forme dans les microsystèmes
I. Roch, L. Buchaillot, O. Millet, H. Bennayyad
Actes des Troisièmes Journées du Pôle Micro-Robotique, 2000, Cachan, France. ⟨hal-00158523⟩
Microscopic characterization of defects using scanning tunneling microscopy
D. Stievenard
Materials Science and Engineering: B, 2000, B71, pp.120-127. ⟨hal-00158667⟩
Method for tight-binding parametrization : application to silicon nanostructures
Yann-Michel Niquet, Christophe Delerue, Guy Allan, Michel Lannoo
Physical Review B: Condensed Matter and Materials Physics (1998-2015), 2000, 62, pp.5109-5116. ⟨10.1103/PhysRevB.62.5109⟩. ⟨hal-00158664⟩
Atomic-scale study of GaMnAs/GaAs
B. Grandidier, J.P. Nys, C. Delerue, D. Stievenard, Y. Higo, M. Tanaka
Applied Physics Letters, 2000, 77, pp.4001-4003. ⟨hal-00158645⟩
Electrical characterization of liquid crystals with microstrip-line device for microwave applications
Bertrand Splingart, Nicolas Tentillier, Fabrice Huret, Jean-Claude Carru, Christian Legrand, P. Kennis
Progress in Electromagnetics Research Symposium - PIERS 2000, Jul 2000, Cambridge, MA, United States. ⟨hal-00158494⟩
Vector and parallel implementations for the FDTD analysis of millimeter wave planar antennas
H. Hoteit, Ronan Sauleau, B. Philippe, Philippe Coquet, J.P. Daniel
International Journal of High Speed Computing, 1999, 10 (2), 209-234 - 25 p. ⟨hal-00557655⟩
Nano-lithography by SPM-induced oxidation: role of space charge in the kinetics of oxide growth
Emmanuel Dubois, Jean-Luc Bubendorff
Proc. of the International Semiconductor Device Research Symposium ISDRS’99, Dec 1999, Charlottesville, United States. ⟨hal-04249195⟩
Role of the defect microstructure on the electrical transport properties in undoped and Si-doped GaN grown by LP-MOVPE
J.-L Farvacque, Z. Bougrioua, I Moerman, G. van Tendeloo, O. Lebedev
Physica B: Condensed Matter, 1999, 273-274, pp.140-143. ⟨10.1016/S0921-4526(99)00431-7⟩. ⟨hal-02906481⟩
Uniformity improvement of linear power pHEMTs using a very high selective wet etching
X. Hue, B. Boudart, B. Bonte, Y. Crosnier
Microwave and Optical Technology Letters, 1999, 23 (3), pp.192 - 194. ⟨10.1002/(SICI)1098-2760(19991105)23:33.0.CO;2-5⟩. ⟨hal-01646851⟩