Publications
Affichage de 15681 à 15690 sur 16273
Microsystème : enjeux et perspectives
D. Collard, L. Buchaillot, Bernard Legrand
Journée IMAPS : International Microelectronics and Packaging Society, 2000, Lille, France. ⟨hal-00158539⟩
Accurate characterization of Silicon-On-Insulator MOSFET's for the design of low voltage, low power RF integrated circuits
J.P. Raskin, R. Gillon, Gilles Dambrine, Jie Chen, D. Vanhoenacker, J.P. Colinge
Analog Integrated Circuits and Signal Processing, 2000, 25, pp.133-155. ⟨hal-00157865⟩
Modelling of heterojunction acoustic charge transport devices
T.B. Edjeou, Tadeusz Gryba, V. Zhang, Véronique Sadaune, Jean-Etienne Lefebvre
Solid-State Electronics, 2000, 44, pp.1127-1133. ⟨hal-00157839⟩
Numerical modeling of shape memory alloy nonlinear behaviour laws : application to an adaptative structure
Anne-Christine Hladky, S. Rafanomezantsoa, L. Buchaillot
ATILA Workshop, 2000, University Park, United States. ⟨hal-00157841⟩
From porous silicon to semiconductor quantum dots
Guy Allan, Christophe Delerue, Michel Lannoo
Zhong Guan Cun for Condensed Matter Physics, 2000, Beijing, China. ⟨hal-00158971⟩
Optimised transceiver for fiber to the home applications
Joseph Harari, Didier Decoster, F. Mallecot, J. Jacquet, A. Leroy, A. Plais, C. Chaumont, F. Doukhan, Y. Arnaudin, A.L. Convert
2000, pp.X-13, X-14. ⟨hal-00158604⟩
New step tunable 2-sections (FP/SG-DFB) semiconductor laser for DWDM applications
M.H. Mourad, Jean-Pierre Vilcot, D. Marcenac, Didier Decoster
1st International Conference on Laser Optics for Young Scientists, LOYS 2000, 2000, Saint Petersbourg, Russia. ⟨hal-00158624⟩
Confinement quantique dans des nanocristaux de silicium et de germanium
Yann-Michel Niquet, Christophe Delerue, Guy Allan, Michel Lannoo
7èmes Journées de la Matière Condensée, 2000, Poitiers, France. ⟨hal-00158950⟩
Nature of impurity states in amorphous silicon
Guy Allan, Christophe Delerue, Michel Lannoo
CECAM Workshop on Electronic and Optical Properties of Semiconducting Glasses, 2000, Lyon, France. ⟨hal-00158966⟩
Scanning tunneling microscopy based lithography in UHV
J.P. Nys, Thierry Melin, B. Grandidier, D. Stievenard
5th MEL-ARI/NID Workshop, 2000, Pise, Italy. ⟨hal-00158944⟩