Publications
Affichage de 15691 à 15700 sur 16109
EAO des circuits microondes en régime temporel : approche physique
Christophe Dalle, M.R. Friscourt
11èmes Journées Nationales Microondes, 1999, Arcachon, France. ⟨hal-00005311⟩
Millimeter-wave pulsed oscillator global modeling by means of electromagnetic, thermal, electrical and carrier transport physical coupled models
Stéphane Beaussart, Oliver Perrin, Marie-Renée Friscourt, Christophe Dalle
IEEE Transactions on Microwave Theory and Techniques, 1999, 47, pp.929-934. ⟨10.1109/22.769328⟩. ⟨hal-00005341⟩
Pulsed measurements of GaN MESFET
B. Boudart, S. Trassaert, Christophe Gaquière, Didier Theron, Y. Crosnier, Fabrice Huet, M.A. Poisson
GAAS 99, 1999, Munich, Germany. ⟨hal-01649413⟩
Metal-semiconductor-metal photodetectors
Joseph Harari, Jean-Pierre Vilcot, Didier Decoster
Wiley Encyclopedia of Electrical and Electronics Engineering, Volume 12, Wiley, pp.561-577, 1999. ⟨hal-00132302⟩
Large signal and pulse instabilities in GaN HFETs
Erhard Kohn, E Strobel, I. Daumiller, Christophe Gaquière, B. Boudart, Didier Theron, N.X. Nguyen, C.N. Nguyen
1st Gallium Nitride Electronic Device Workshop, 1999, Cornell, United States. ⟨hal-01654323⟩
Electromagnetic waves in finite superlattices with buffer and cap layers
M. Lahlaouti, Abdellatif Akjouj, B. Djafari-Rouhani, Leonard Dobrzynski, M. Hammouchi, E. El Boudouti, A. Nougaoui
Journal of the Optical Society of America. A Optics, Image Science, and Vision, 1999, 16 (7), pp.1703. ⟨10.1364/JOSAA.16.001703⟩. ⟨hal-04070498⟩
High-frequency four noise parameters of silicon-on-insulator-based technology MOSFET for the design of low-noise RF integrated circuits
Gilles Dambrine, J.-P. Raskin, Francois Danneville, D. Vanhoenackel Janvier, J.-P. Colinge, A. Cappy
IEEE Transactions on Electron Devices, 1999, 46 (8), pp.1733-1741. ⟨10.1109/16.777164⟩. ⟨hal-03612809⟩
Transferred InP-based HBVs on glass substrate
S. Arscott, P. Mounaix, D. Lippens
Electronics Letters, 1999, 35 (17), pp.1493. ⟨10.1049/el:19990984⟩. ⟨hal-02348069⟩
Nanometer scale lithography on silicon, titanium and PMMA resist using scanning probe microscopy
Emmanuel Dubois, Jean-Luc Bubbendorff
Solid-State Electronics, 1999, 43 (6), pp.1085-1089. ⟨10.1016/S0038-1101(99)00029-5⟩. ⟨hal-04246744⟩
Influence of the Source Inductance Parasitic Effect on the Conversion Gain of the HEMT Gate Mixer
Rachid Allam, Christophe Kolanowski, Jean-Marie Paillot, Claude Duvanaud, Y. Crosnier
Microwave and Optical Technology Letters, 1999, 22 (3), pp.149--151. ⟨10.1002/(SICI)1098-2760(19990805)22:33.0.CO;2-K⟩. ⟨hal-03360876⟩