Publications
Affichage de 15791 à 15800 sur 16273
Elaboration and characterization of PNZT thin films deposited on silicon by RF cathodic sputtering
T. Haccart, Eric Cattan, Denis Remiens
European Physical Journal: Applied Physics, 2000, 11, pp.103-106. ⟨10.1051/epjap:2000150⟩. ⟨hal-00158541⟩
RF power MISFET's using thin LT GaAs as a passivator
D. Theron, B. Boudart, Christophe Gaquière, Jean-Claude de Jaeger
Workshop on Compound Semiconductor Materials and Devices, WOCSEMMAD 2000, 2000, San Diego, CA, United States. ⟨hal-00159031⟩
Detection of multiple signal echoes with a one bit correlator receiver
M. Saint-Venant, S. Mouty, Jamal Assaad, Fabrice Lefebvre, P. Deloof
2000, pp.196-201. ⟨hal-00159069⟩
Acoustic scattering from complex elastic shells : visualization of So, Ao and A waves
L. Derbesse, Philippe Pernod, V. Latard, A. Merlen, D. Decultot, N. Touraine, G. Maze
Ultrasonics, 2000, 38, pp.860-863. ⟨hal-00158449⟩
Microcapteurs thermiques et applications
P. Godts, Didier Leclercq
Journée ITF-IEMN, Textile-Electronique, 2000, Villeneuve d'Ascq, France. ⟨hal-00158496⟩
Elaboration et caractérisation physique par microscopie à champ proche de nanostructures semi-conductrices
Bernard Legrand
2000. ⟨hal-00158616⟩
Full wave analysis of conductor and substrate losses in high speed VLSI interconnects
Fabrice Huret, Denis Deschacht, Gregory Servel, Erick Paleczny, Jean-François Legier, P. Kennis
2000, pp.266-269. ⟨hal-00158579⟩
Calibration of a two-dimensional numerical model for the optimization of LOCOS type isolations by response surface methodology
V. Senez, T. Hoffmann, A. Tixier
IEEE Transactions on Semiconductor Manufacturing, 2000, 13, pp.416-426. ⟨hal-00158511⟩
Reduction of temporal busyness in low bit rate video coding
François-Xavier Coudoux, Marc G. Gazalet, Patrick Corlay
2000, pp.329-332. ⟨hal-00159054⟩
Contribution à la mise au point d'un dispositif de caractérisation ultrasonore du tissu osseux par ondes de Lamb
D.D. Ahite
2000. ⟨hal-00159066⟩