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Affichage de 15911 à 15920 sur 16387

Microscopic characterization of defects using scanning tunneling microscopy

D. Stievenard

Materials Science and Engineering: B, 2000, B71, pp.120-127. ⟨hal-00158667⟩

P. Mounaix, S. Arscott, T. David, Florence Podevin, X. Melique, D. Lippens

2000, pp.28-31. ⟨hal-00158204⟩

T. David, P. Mounaix, X. Melique, F. Mollot, O. Vanbésien, M. Chaubet, D. Lippens

Proceedings of the 11th International Symposium on Space Terahertz Technology, 2000, Ann Arbor, MI, United States. ⟨hal-00158223⟩

D. Glay, T. Lasri, A. Mamouni, Y. Leroy

6èmes Journées Caractérisation Microondes et Matériaux, JCMM 2000, 2000, Paris, France. ⟨hal-00158162⟩

S. Arscott, T. David, X. Melique, P. Mounaix, D. Lippens

2000, pp.561-564. ⟨hal-00158203⟩

M. Lahlaouti, Abdellatif Akjouj, B. Djafari-Rouhani, Leonard Dobrzynski

Physical Review B, 2000, 61 (3), pp.2059-2064. ⟨10.1103/PhysRevB.61.2059⟩. ⟨hal-04070077⟩

Anne-Christine Hladky, P. Langlet, M. de Billy

Journal of the Acoustical Society of America, 2000, 108, pp.3079-3083. ⟨hal-00157821⟩

Anne-Christine Hladky, C. Granger

2000, pp.64-65. ⟨hal-00157823⟩

H. Hoteit, Ronan Sauleau, B. Philippe, Philippe Coquet, J.P. Daniel

International Journal of High Speed Computing, 1999, 10 (2), 209-234 - 25 p. ⟨hal-00557655⟩

Emmanuel Dubois, Jean-Luc Bubendorff

Proc. of the International Semiconductor Device Research Symposium ISDRS’99, Dec 1999, Charlottesville, United States. ⟨hal-04249195⟩