Publications

Affichage de 4581 à 4590 sur 16058


  • COMM

[Invited] MEMS-based atomic force microscopy probes: from electromechanical to optomechanical vibrating sensors

Bernard Legrand, Lucien Schwab, Pierre Allain, Ivan Favero, Marc Faucher, Didier Theron, Benjamin Walter, Jean-Paul Salvetat, Sébastien Hentz, Guillaume Jourdan

Scanning probe microscopy has been one of the most important instrumental discoveries during the last quarter of the last century. In particular, atomic force microscopy (AFM) is a cross-disciplinary technique able to provide sample morphology down to the atomic scale. It offers invaluable tools to…

AVS 65th International Symposium & Exhibition, American Vacuum Society, Oct 2018, Long Beach, United States. ⟨hal-01908666⟩

  • ART

Chemical nature of the anion antisite in dilute phosphide GaAs1−xPx alloy grown at low temperature

T. Demonchaux, K. K. Sossoe, M. M. Dzagli, J. P. Nys, Maxime Berthe, David Troadec, A. Addad, M. Veillerot, G. Patriarche, H. J. Von Bardeleben, M. Schnedler, Christophe Coinon, Isabelle Lefebvre, M. A. Mohou, D. Stievenard, Jean-Francois Lampin, Ph. Ebert, X. Wallart, B. Grandidier

While nonstoichiometric binary III-V compounds are known to contain group-V antisites, the growth of ternary alloys consisting of two group-V elements might give additional degrees of freedom in the chemical nature of these antisites. Using cross-sectional scanning tunneling microscopy (STM), we…

Physical Review Materials, 2018, 2 (10), pp.104601. ⟨10.1103/PhysRevMaterials.2.104601⟩. ⟨hal-01912292⟩