Publications

Affichage de 6001 à 6010 sur 16179


  • Autre publication scientifique

Advances in Historical Studies [Editor in Chief 5/1]

Raffaele Pisano

2016. ⟨hal-04511030⟩

  • Communication dans un congrès

Smartphone-controlled electro-wetting on dielectric microfluidics

Zhi Zeng, Kaidi Zhang, Wei Wang​, Wei-Jiang Xu, Jia Zhou

A prototype of low-cost compact digital microfluidics analysis platform controlled by a smartphone has been built. With customized circuits, the platform takes the advantages of portability and easy-application with a friendly user interface. It can manipulate droplet moving, merging and mixing…

11th IEEE International Conference on Advanced Semiconductor Integrated Circuits, ASICON 2015, Nov 2015, Chengdu, China. pp.1-4, ⟨10.1109/ASICON.2015.7517018⟩. ⟨hal-04088243⟩

  • Communication dans un congrès

Contact resistance study of “edge-contacted” metal-graphene interfaces

V. Passi, A. Gahoi, J. Ruhkopf, S. Kataria, Francois Vaurette, E. Pallecchi, H. Happy, M. C. Lemme

The contact resistance RC of "edge-contacted" metal-graphene interfaces is systematically studied. Our experiments demonstrate a reduction of contact resistance by intentional patterning of graphene to create "edge contacts". The parameter space for different hole patterns in…

46th European Solid-State Device Conference, ESSDERC 2016, Sep 2016, Lausanne, Switzerland. pp.236-239, ⟨10.1109/ESSDERC.2016.7599629⟩. ⟨hal-03335829⟩

  • Communication dans un congrès

Personal radio-frequency exposimeters in indoor diffuse environments: Measurement and simulation

Reza Aminzadeh, Arno Thielens, Aliou Bamba, Lamine Kone, Davy Gaillot, M. Lienard, Luc Martens, Wout Joseph

The response of personal exposimeters (PEMs) is studied under diffuse field exposure in indoor environments. A numerical model and a setup for on-body calibration measurements in a reverberation chamber (RC) is proposed for 897–5500 MHz. The proposed numerical simulations are in good agreement with…

10th European Conference on Antennas and Propagation, EuCAP 2016, Apr 2016, Davos, Switzerland. Session A23 - Dosimetry, exposure and SAR assessment, 5 p., ⟨10.1109/EuCAP.2016.7481668⟩. ⟨hal-03346232⟩

  • Communication dans un congrès

Deep Trench Isolation and Through Silicon Via Wetting Characterization by High-Frequency Acoustic Reflectometry

Christophe Virgilio, Lucile Broussous, Philippe Garnier, Julien Carlier, Pierre Campistron, V. Thomy, Malika Toubal, Pascal Besson, Laurence Gabette, Bertrand Nongaillard

Wetting efficiency of microstructures or nanostructures patterned on Si wafers is a real concern in integrated circuits manufacturing. We present here a high-frequency acoustic method which enables the local determination of the wetting state of a liquid on real DTI and TSV structures. Partial…

13th International Symposium on Ultra Clean Processing of Semiconductor Surfaces (UCPSS), Sep 2016, Knokke, Belgium. ⟨10.4028/www.scientific.net/SSP.255.129⟩. ⟨hal-03280231⟩

  • Communication dans un congrès

65 nm SOI CMOS 60 GHz passive mixer for six-port technology

Kamel Haddadi, Christophe Loyez

This work describes the design and measurements of a 60 GHz passive mixer for six-port applications operating and implemented in a 65nm SOI CMOS technology. The mixer topology, consisting only of a n-MOS cold-FET and CPW transmission line matching networks, avoids the use of coupler in front of the…

IEEE Topical Conference on Wireless Sensors and Sensor Networks, WiSNet 2016, Jan 2016, Austin, TX, United States. pp.52-55, ⟨10.1109/WISNET.2016.7444320⟩. ⟨hal-03224660⟩

  • Communication dans un congrès

A co-design space exploration tool for avionic high performance heterogeneous embedded architectures

Geoffroy Pertuisot, Nicolas Belanger, Yassin El Hillali, Smail Niar, Atika Rivenq

Avionics in the helicopter manufacturers' landscape faces new challenges. Whereas customers raise continuously their needs in terms of new functions and embedded systems performances, certification authorities maintain complex rules to fulfill for parallel computing. This constraining…

11th International Design and Test Symposium, IDT 2016, Dec 2016, Hammamet, Tunisia. pp.77-82, ⟨10.1109/IDT.2016.7843018⟩. ⟨hal-03528686⟩

  • Communication dans un congrès

Modeling transistor level masking of soft errors in combinational circuits

Ihsen Alouani, Smail Niar, Yassin El Hillali, Atika Rivenq

Technology scaling in modern electronic circuits shrinks the transistor size and dramatically increases the sensitivity of semiconductor devices to radiations. Consequently, soft errors emerged as a serious reliability threat in both sequential and combinational circuits. To accurately estimate…

2015 IEEE East-West Design and Test Symposium, EWDTS 2015, Sep 2015, Batumi, United States. pp.7493140, ⟨10.1109/EWDTS.2015.7493140⟩. ⟨hal-03528693⟩