Publications
Affichage de 6231 à 6240 sur 16256
A Digital Delay Line with Coarse/Fine tuning through Gate/Body biasing in 28nm FDSOI
Ilias Sourikopoulos, Antoine Frappé, Andreia Cathelin, Laurent Clavier, Andreas Kaiser
46th European Solid-State Device Research Conference (ESSDERC) / 42nd European Solid-State Circuits Conference (ESSCIRC), Sep 2016, Lausanne, Switzerland. pp.145-148, ⟨10.1109/ESSCIRC.2016.7598263⟩. ⟨hal-03270099⟩
Characterization and modeling of traps and RF frequency dispersion in AlGaN/AlN/GaN HEMTs
Hector Sanchez-Martin, Oscar Garcia-Perez, Ignacio Íñiguez-De-La-Torre, Susana Perez, Tomás González, Javier Mateos, Philippe Altuntas, N. Defrance, Marie Lesecq, Virginie Hoel, Yvon Cordier, Stephanie Rennesson
11th European Microwave Integrated Circuits Conference (EuMIC), Oct 2016, London, United Kingdom. paper EuMIC10-03, 153-156, ⟨10.1109/EuMIC.2016.7777513⟩. ⟨hal-03270103⟩
Magnetic-Phase Dependence of the Spin Carrier Mean Free Path in Graphene Nanoribbons
Jing Li, Yann-Michel Niquet, Christophe Delerue
Physical Review Letters, 2016, 116 (23), pp.236602. ⟨10.1103/PhysRevLett.116.236602⟩. ⟨cea-01849844⟩
METASTABILITY OF FINITE STATE MARKOV CHAINS: A RECURSIVE PROCEDURE TO IDENTIFY SLOW VARIABLES FOR MODEL REDUCTION
Claudio Landim, T. Xu
ALEA : Latin American Journal of Probability and Mathematical Statistics, 2016. ⟨hal-01728594⟩
Bulk acoustic wave transformer employing periodically polled array of piezoelectric rods
Victor Plessky, Ventsislav Yantchev, C. Granger, Anne-Christine Hladky
IEEE International Ultrasonics Symposium (IUS), Sep 2016, Tours, France. ⟨10.1109/ULTSYM.2016.7728583⟩. ⟨hal-03300124⟩
Inverse saffman-taylor experiments with particles lead to capillarity driven fingering instabilities
Ilyesse Bihi, Michael Baudoin, Jason E. Butler, Christine Faille, Farzam Zoueshtiagh
Physical Review Letters, 2016, 117 (3), ⟨10.1103/PhysRevLett.117.034501⟩. ⟨hal-02636447⟩
Reliability assessment of ultra-short gate length AlGaN/GaN HEMTs on Si substrate by on-state step stress
Hadhemi Lakhdar, Nathalie Labat, Arnaud Curutchet, N. Defrance, Marie Lesecq, J.C. Dejaeger, Nathalie Malbert
Microelectronics Reliability, 2016. ⟨hal-01718762⟩
InAs/Al<sub>0.4</sub>Ga<sub>0.6</sub>Sb side gated vertical TFET on GaAs substrate
Vinay Chinni, Mohammed Zaknoune, X. Wallart, L. Desplanque
Above 2000 V breakdown voltage at 600 K GaN-on-silicon high electron mobility transistors
Nicolas Herbecq, Isabelle Roch-Jeune, Astrid Linge, Malek Zegaoui, Pierre-Olivier Jeannin, Nicolas Clément, Jean-Paul Rouger, F Medjdoub
Physica Status Solidi A (applications and materials science), 2016, 213 (4), pp.873--877. ⟨10.1002/pssa.201532572⟩. ⟨hal-02277752⟩
Containment nuclear plant structures evaluation by non destructive testing: strategy and results
Vincent Garnier, Jean-Marie Henault, Hamid Hafid, Jérôme Verdier, Jean François Chaix, Odile Abraham, Zoubir Medhi Sbartaï, Jean-Paul Balayssac, Bogdan Piwakowski, Géraldine Villain, Xavier Derobert, Cédric Payan, Sandrine Rakotonarivo, Éric Larose, Hognon Sogbossi, Quang Anh Vu, Martin Lott, Jean-Baptiste Legland, Olivier Durand, Radoslaw Drelich, Charles Ciccarone
TINCE 2016 3rd Conference on Technological Innovations in Nuclear Civil Engineering, Sep 2016, Paris, France. 13p. ⟨hal-01599552⟩