Publications

Affichage de 6241 à 6250 sur 16309


  • Communication dans un congrès

Development of a reference wafer for on-wafer testing of extreme impedance devices

H. Votsi, I. Roch-Jeune, Kamel Haddadi, C. Li, Gilles Dambrine, P. H. Aaen, N. Ridler

This paper describes the design, fabrication, and testing of an on-wafer substrate that has been developed specifically for measuring extreme impedance devices using an on-wafer probe station. Such devices include carbon nano-tubes (CNTs) and structures based on graphene which possess impedances in…

88th ARFTG Microwave Measurement Symposium, ARFTG 2016, Dec 2016, Austin, United States. 4 p., ⟨10.1109/ARFTG.2016.7839719⟩. ⟨hal-03224658⟩

  • Article dans une revue

High photocatalytic activity of plasmonic Ag@AgCl/Zn2 SnO4 nanocomposites synthesized using hydrothermal method

Monaam Ben Ali, Abderrahmane Hamdi, Habib Elhouichet, Brigitte Sieber, Ahmed Addad, Yannick Coffinier, Luc Boussekey, Mokhtar Férid, Sabine Szunerits, Rabah Boukherroub

Ag@AgCl/Zn 2 SnO 4 (ZTO) nanocomposites were successfully prepared by a hydrothermal method.

RSC Advances, 2016, 6 (83), pp.80310-80319. ⟨10.1039/C6RA14813A⟩. ⟨hal-03837468⟩

  • Article dans une revue

Wetting characterization of high aspect ratio nanostructures by gigahertz acoustic reflectometry

Christophe Virgilio, Julien Carlier, Pierre Campistron, Malika Toubal, Philippe Garnier, L. Broussous, V. Thomy, Bertrand Nongaillard

Wetting efficiency of microstructures or nanostructures patterned on Si wafers is a real challenge in integrated circuits manufacturing. In fact, bad or non-uniform wetting during wet processes limits chemical reactions and can lead to non-complete etching or cleaning inside the patterns and device…

International Journal of Mechanical and Mechatronics Engineering, 2016, 10 (3), pp.413-418. ⟨hal-03560404⟩

  • Communication dans un congrès

Metal/insulator/semiconductor contacts for ultimately scaled CMOS nodes: projected benefits and remaining challenges

Julien Borrel, Louis Hutin, Helen Grampeix, Emmanuel Nolot, Magali Tessaire, Guillaume Rodriguez, Yves Morand, Fabrice Nemouchi, Magali Gregoire, Emmanuel Dubois, Maud Vinet

In this paper, some key fundamental aspects of Metal / Insulator / Semiconductor contacts as well as practical issues occurring with their implementation are reviewed in order to fully comprehend the opportunities and limitations of this approach.

IWJT 2016 - 16th International Workshop on Junction Technology, May 2016, Shanghai, China. pp.14-19. ⟨hal-03325000⟩

  • Communication dans un congrès

New Optical Approach of SAW Delay Line Characterization

Lyes Djoumi, Nikolay Smagin, Meddy Vanotti, Dame Fall, Etienne Herth, Marc Duquennoy, Mohammadi Ouaftouh, Virginie Blondeau-Patissier, Frédéric Jenot

Surface acoustic wave devices are usually characterized solely through their electrical parameters. Mechanical displacements can also be numerically computed using finite element software. In this paper, we show that this characterization can be supplemented using an interferometer system capable…

30th Eurosensors Conference, EUROSENSORS XXX, Sep 2016, Budapest, Hungary. pp.838-843. ⟨hal-03586205⟩

  • Communication dans un congrès

Estimation of an approximated likelihood ratio for iterative decoding in impulsive environment

Vincent Dimanche, Alban Goupil, Laurent Clavier, Guillaume Gelle

IEEE Wireless Communications and Networking Conference (WCNC), 2016, Doha, Qatar. pp.1-6, ⟨10.1109/WCNC.2016.7565031⟩. ⟨hal-02088568⟩

  • Communication dans un congrès

Modeling transistor level masking of soft errors in combinational circuits

Ihsen Alouani, Smail Niar, Yassin El Hillali, Atika Rivenq

Technology scaling in modern electronic circuits shrinks the transistor size and dramatically increases the sensitivity of semiconductor devices to radiations. Consequently, soft errors emerged as a serious reliability threat in both sequential and combinational circuits. To accurately estimate…

2015 IEEE East-West Design and Test Symposium, EWDTS 2015, Sep 2015, Batumi, United States. pp.7493140, ⟨10.1109/EWDTS.2015.7493140⟩. ⟨hal-03528693⟩